| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | J | jnl |
SERA: statistical error rate analysis for profit-oriented performance binning of resilient circuits.
Integr.
|
| 2017 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
ISPD
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | — | conf |
DFTS
|
| 2013 | A* | conf |
DAC
|
| 2013 | — | conf |
MWSCAS
|
| 2013 | A* | conf |
DAC
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | A | conf |
ICCAD
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | — | conf |
DFT
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | A | conf |
ICCAD
|
| 2010 | J | jnl |
J. Low Power Electron.
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
DFT
|
| 2009 | A | conf |
DATE
|
| 2009 | A | conf |
ICCAD
|
| 2009 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | A | conf |
ICCAD
|
| 2008 | — | conf |
EIAT/IETA
|
| 2008 | A | conf |
ISLPED
|
| 2008 | — | conf |
DFT
|
| 2008 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2008 | C | conf |
ICCD
|
| 2008 | A | conf |
ITC
|
| 2007 | C | conf |
An efficient routing method for pseudo-exhaustive built-in self-testing of high-speed interconnects.
ICCD
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | — | conf |
ISVLSI
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | A* | conf |
DAC
|
| 2006 | A | conf |
ITC
|
| 2006 | — | conf |
DFT
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | — | conf |
DFT
|
| 2005 | — | conf |
ASP-DAC
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2004 | Misc | conf |
VTS
|
| 2004 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2004 | A | conf |
ISLPED
|
| 2004 | Misc | conf |
VLSI Design
|
| 2004 | — | conf |
ISCAS (2)
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2003 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 2003 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2002 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2001 | Misc | conf |
VLSI Design
|
| 2001 | Misc | conf |
VLSI Design
|
| 2001 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | J | jnl |
VLSI Design
|
| 2001 | — | conf |
DFT
|
| 2001 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2001 | J | jnl |
VLSI Design
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
LATW
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
DFT
|
| 2000 | A | conf |
ICCAD
|
| 2000 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1999 | Misc | conf |
VTS
|
| 1999 | — | conf |
DFT
|
| 1999 | A* | conf |
DAC
|
| 1999 | — | conf |
ISCAS (1)
|
| 1999 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1998 | Misc | conf |
VLSI Design
|
| 1998 | A | conf |
ITC
|
| 1998 | A | conf |
ITC
|
| 1998 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 1998 | J | jnl |
VLSI Design
|
| 1997 | Misc | conf |
VLSI Design
|
| 1997 | J | jnl |
J. Electron. Test.
|
| 1996 | J | jnl |
VLSI Design
|
| 1996 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | Misc | conf |
VLSI Design
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | Misc | conf |
VLSI Design
|
| 1995 | J | jnl |
IEEE Trans. Syst. Man Cybern.
|
| 1995 | J | jnl |
IEEE Trans. Syst. Man Cybern.
|
| 1995 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1994 | B | conf |
ICPADS
|
| 1994 | J | jnl |
IEEE Trans. Computers
|
| 1994 | Misc | conf |
VLSI Design
|
| 1993 | Misc | conf |
VLSI Design
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | C | conf |
ISCAS
|
| 1993 | A | conf |
ITC
|
| 1993 | A* | conf |
DAC
|
| 1992 | J | jnl |
IEEE Trans. Syst. Man Cybern.
|
| 1991 | J | jnl |
J. Electron. Test.
|
| 1991 | A | conf |
ITC
|
| 1991 | C | conf |
ICCD
|
| 1990 | J | jnl |
J. Electron. Test.
|
| 1990 | J | jnl |
IEEE Trans. Syst. Man Cybern.
|
| 1989 | A* | conf |
DAC
|
| 1989 | A* | conf |
DAC
|
| 1989 | C | conf |
ICCD
|