Weiwei Mao

23 papers A* 5A 6Journal 10Unranked 2
YearRankTypeTitle / Venue / Authors
2026 J jnl
English Vowel Feature Extraction Based on Interpolated Wavelet Pyramid Decomposition.
Circuits Syst. Signal Process.
Weiwei Mao, Xu Gong, Yantao Duan, Zhiguo Zhang
2024 J jnl
Analysis of the Research Progress of Electromagnetic Railgun Based on CiteSpace.
IEEE Access
Weiwei Mao, Teng Pang, Zhirong Guo, Hongbao Bai, Zhixiong Huang, Xiaoyu Jin
2024 J jnl
Short-Term Power Load Forecasting Method Based on GRU-Transformer Combined Neural Network Model.
J. Comput. Inf. Technol.
Weiwei Mao, Suping Yu, Wenqing Chen
2022 J jnl
Slicing-Tracking-Detection: Simultaneous Multi-Cylinder Detection From Large-Scale and Complex Point Clouds.
IEEE Trans. Vis. Comput. Graph.
Zhuheng Lu, Weiwei Mao, Yuewei Dai, Weiqing Li, Zhiyong Su
2020 J jnl
Partial Matching of Large Scale Process Plant Models Using Random Walk on Graphs.
IEEE Access
Weiwei Mao, Zhuheng Lu, Yuewei Dai, Weiqing Li, Zhiyong Su
2019 J jnl
SmartWAZ: Design and Implementation of a Smart WiFi Access System Assisted by Zigbee.
IEEE Access
Bo Zhang, Jinhang Zuo, Weiwei Mao
2013 — conf
Quantized-data consensus of second-order multi-agent systems with directed topology.
ASCC
Chao Wang, Weiwei Mao, Xiaobo Li, Weisheng Chen, Jing Li
1996 A conf
Improving Gate Level Fault Coverage by RTL Fault Grading.
ITC
Weiwei Mao, Ravi K. Gulati
1994 J jnl
Reducing correlation to improve coverage of delay faults in scan-path design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Weiwei Mao, Michael D. Ciletti
1994 A conf
Structure and Metrology for a Single-wire Analog.
ITC
Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati
1992 — conf
A quantitative measure of robustness for delay fault testing.
EURO-DAC
Weiwei Mao, Michael D. Ciletti
1992 A conf
Detection of "Undetectable" Faults Using I
ITC
Ravi K. Gulati, Weiwei Mao, Deepak K. Goel
1992 J jnl
IDDQ testing: A review.
J. Electron. Test.
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
1992 J jnl
Quietest: A methodology for selecting IDDQ test vectors.
J. Electron. Test.
Weiwei Mao, Ravi K. Gulati
1992 A conf
Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults.
ITC
Weiwei Mao, Michael D. Ciletti
1991 A* conf
Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage.
DAC
Weiwei Mao, Michael D. Ciletti
1990 A* conf
A Variable Observation Time Method for Testing Delay Faults.
DAC
Weiwei Mao, Michael D. Ciletti
1990 A conf
Arrangement of latches in scan-path design to improve delay fault coverage.
ITC
Weiwei Mao, Michael D. Ciletti
1990 J jnl
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Weiwei Mao, Michael D. Ciletti
1990 A conf
QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults.
ICCAD
Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti
1989 A* conf
A Simplified Six-waveform Type Method for Delay Fault Testing.
DAC
Weiwei Mao, Michael D. Ciletti
1988 A* conf
Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation.
DAC
Weiwei Mao, Michael D. Ciletti
1986 A* conf
Robust test generation algorithm for stuck-open fault in CMOS circuits.
DAC
Weiwei Mao, Xieting Ling