| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Proc. ACM Softw. Eng.
|
| 2025 | J | jnl |
IEEE Geosci. Remote. Sens. Lett.
|
| 2024 | A* | conf |
ICSE
|
| 2024 | J | jnl |
CoRR
|
| 2024 | B | conf |
LCTES
|
| 2024 | C | conf |
CSCWD
|
| 2024 | J | jnl |
Sensors
|
| 2024 | C | conf |
CSCWD
|
| 2024 | B | conf |
CEC
|
| 2024 | A* | conf |
SP
|
| 2023 | J | jnl |
J. Frankl. Inst.
|
| 2023 | J | jnl |
Comput. Networks
|
| 2023 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2023 | J | jnl |
J. Netw. Comput. Appl.
|
| 2023 | A | conf |
ICDCS
|
| 2023 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2023 | A* | conf |
ASE
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2022 | J | jnl |
Entropy
|
| 2022 | A | conf |
ISSTA
|
| 2021 | J | jnl |
Comput. Networks
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
AIAM (ACM)
|
| 2021 | — | conf |
AIAM (ACM)
|
| 2021 | — | conf |
CIPAE
|
| 2021 | — | conf |
SIGMETRICS (Abstracts)
|
| 2021 | J | jnl |
Proc. ACM Meas. Anal. Comput. Syst.
|
| 2021 | — | conf |
AIAM (ACM)
|
| 2020 | J | jnl |
A Demodulation Model of Dynamic Low-Finesse Fabry-Perot Cavity Based on the Instantaneous Frequency.
IEEE Access
|
| 2020 | J | jnl |
Sensors
|
| 2019 | J | jnl |
Sensors
|
| 2016 | — | conf |
IIKI
|
| 2015 | J | jnl |
Sensors
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Appl. Math. Comput.
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2012 | — | conf |
BIFE
|
| 2012 | — | conf |
BMEI
|
| 2011 | — | conf |
FSKD
|
| 2009 | J | jnl |
Sensors
|
| 2009 | J | jnl |
Inf. Process. Manag.
|
| 2009 | — | conf |
IFITA (3)
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2008 | — | conf |
ICNC (7)
|
| 2006 | — | conf |
ISNN (2)
|
| 2006 | — | conf |
ICB
|
| 2006 | — | conf |
ICPR (3)
|
| 2006 | — | conf |
ICPR (4)
|
| 2006 | — | conf |
ISDA (1)
|
| 2006 | — | conf |
ROBIO
|
| 2006 | J | jnl |
Microelectron. J.
|
| 2005 | B | conf |
AINA
|
| 2005 | — | conf |
ISNN (3)
|
| 2005 | — | conf |
IWBRS
|
| 2005 | — | conf |
ICAPR (2)
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|