| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Integr.
|
| 2026 | J | jnl |
Displays
|
| 2025 | J | jnl |
Trans. Inst. Meas. Control
|
| 2025 | J | jnl |
J. Field Robotics
|
| 2024 | J | jnl |
Appl. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | C | conf |
IGARSS
|
| 2024 | J | jnl |
Comput. Electron. Agric.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Stat. Anal. Data Min.
|
| 2023 | J | jnl |
J. Syst. Control. Eng.
|
| 2023 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Future Gener. Comput. Syst.
|
| 2021 | J | jnl |
Ann. Oper. Res.
|
| 2020 | J | jnl |
Sensors
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Sensors
|
| 2018 | J | jnl |
Remote. Sens.
|
| 2018 | J | jnl |
Remote. Sens.
|
| 2018 | J | jnl |
Remote. Sens.
|
| 2017 | — | conf |
ICIG (2)
|
| 2017 | — | conf |
ICIG (3)
|
| 2017 | J | jnl |
Multim. Tools Appl.
|
| 2016 | — | conf |
VRCAI
|
| 2016 | J | jnl |
J. Comput. Appl. Math.
|
| 2015 | A | conf |
IROS
|
| 2014 | J | jnl |
Remote. Sens.
|
| 2014 | J | jnl |
CoRR
|
| 2012 | J | jnl |
Discret. Math.
|
| 2012 | — | conf |
Computer-Aided Diagnosis
|
| 2012 | J | jnl |
J. Digit. Imaging
|
| 2012 | — | conf |
Computer-Aided Diagnosis
|
| 2012 | — | conf |
Computer-Aided Diagnosis
|
| 2012 | — | conf |
Computer-Aided Diagnosis
|
| 2011 | J | jnl |
Math. Comput. Model.
|
| 2010 | B | conf |
Image Processing
|
| 2010 | — | conf |
A new multi-view identification scheme for breast masses in mammography using multi-agent algorithm.
ICCA
|
| 2010 | J | jnl |
Math. Comput. Model.
|
| 2010 | — | conf |
BIBM
|
| 2010 | — | conf |
Computer-Aided Diagnosis
|
| 2010 | J | jnl |
Int. J. Uncertain. Fuzziness Knowl. Based Syst.
|
| 2009 | — | conf |
IGARSS (3)
|
| 2009 | — | conf |
CSO (1)
|
| 2008 | J | jnl |
CoRR
|
| 2008 | B | conf |
ISIT
|
| 2008 | — | conf |
BMEI (1)
|
| 2007 | C | conf |
BIBE
|
| 2006 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2004 | — | conf |
ISNN (1)
|
| 2003 | — | conf |
ICASSP (3)
|
| 1998 | J | jnl |
IEEE Des. Test Comput.
|