| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Appl. Math. Comput.
|
| 2023 | J | jnl |
Sensors
|
| 2022 | — | conf |
ISCID
|
| 2022 | J | jnl |
Int. J. Medical Informatics
|
| 2019 | — | conf |
ASICON
|
| 2019 | — | conf |
ASICON
|
| 2018 | C | conf |
ISCAS
|
| 2018 | J | jnl |
Wirel. Pers. Commun.
|
| 2018 | J | jnl |
J. Frankl. Inst.
|
| 2016 | J | jnl |
J. Frankl. Inst.
|
| 2014 | J | jnl |
Signal Process.
|
| 2014 | J | jnl |
Reliability investigation of AlGaN/GaN high electron mobility transistors under reverse-bias stress.
Microelectron. Reliab.
|