Wei-Ting Kary Chien

17 papers Journal 12Unranked 5
YearRankTypeTitle / Venue / Authors
2019 J jnl
Fast Semiconductor Reliability Assessments Using SPRT.
IEEE Trans. Reliab.
Wei-Ting Kary Chien, Andrew Chung, Way Kuo
2018 J jnl
Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies.
Microelectron. Reliab.
Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang
2017 J jnl
Exploration of baking temperature effects on 28 nm BEOL reliability.
Microelectron. Reliab.
Xiangfu Zhao, Wei-Ting Kary Chien
2016 J jnl
Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests.
Microelectron. Reliab.
Wei-Ting Kary Chien, Atman Yong Zhao, Yueqin Zhu, Yongliang Song
2016 J jnl
Influence of I/O oxide process on the NBTI performance of 28 nm HfO
Microelectron. Reliab.
Wei-Ting Kary Chien, Yueqin Zhu, Yongliang Song, Atman Yong Zhao
2015 — conf
Comprehensive Wafer Level Package Die Processing Service quality control enhancement.
IEEM
John Qiao, Morn Jin, Wenwen He, Wei-Ting Kary Chien, Shirley Zhao
2015 J jnl
Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index.
IEEE Trans. Reliab.
Siyuan Frank Yang, Wei-Ting Kary Chien
2015 — conf
The investigation of semiconductor shipping bag reliability.
IEEM
Hailin Jonson Gao, Xueliang Ruben Zhang, Yanju Lisa Yu, Kaiyuan Kevin Chang, Wei-Ting Kary Chien
2015 — conf
The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics.
IRPS
Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Flora Cheng
2015 — conf
Wafer level package wafer probing shift error-proof quality control.
IEEM
Morn Jin, Wenwen He, John Qiao, Wei-Ting Kary Chien, Shirley Zhao
2014 — conf
A study on the optimization of wafer pre-treatment conditions for thin film stability monitor.
IEEM
Taicheng Kevin Gong, Yanju Lisa Yu, Yan Kaily Cao, Xueliang Ruben Zhang, Kaiyuan Kevin Chang, Wei-Ting Kary Chien
2012 J jnl
Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs.
IEEE Trans. Reliab.
Wei-Ting Kary Chien, Ming Li
2010 J jnl
A Practical, Innovative Method for Electro-Static Discharge Data Analysis.
IEEE Trans. Reliab.
Wei-Ting Kary Chien, Siyuan Frank Yang
2007 J jnl
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing.
IEEE Trans. Reliab.
Wei-Ting Kary Chien, Siyuan Frank Yang
2004 J jnl
Some practical considerations for effective and efficient wafer-level reliability control.
Microelectron. Reliab.
Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai
2003 J jnl
A cost-effective wafer-level reliability test system for integrated circuit makers.
IEEE Trans. Instrum. Meas.
Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai
2003 J jnl
Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation.
Microelectron. Reliab.
Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai