Wei-Shen Wang

12 papers A* 1A 2Misc 1Journal 4Unranked 4
YearRankTypeTitle / Venue / Authors
2025 — conf
Automatic IR-Informed Timing and Timing-Aware IR Optimization.
ITC-Asia
Po-Chieh Yen, Wei-Shen Wang, Shao-Yu Wu, Bing-Chen Li, James Chien-Mo Li, Norman Chang, Ying-Shiun Li, Lang Lin, Akhilesh Kumar
2025 — conf
Efficient ML-Based Transient Thermal Prediction for 3D-ICs.
ASP-DAC
Yun-Feng Yang, Wei-Shen Wang, Yung-Jen Lee, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li, Jessica Yen, Lang Lin
2024 — conf
Thermal-Aware Test Frequency Optimization.
ITC-Asia
Wei-Shen Wang, Zhe-Jia Liang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li
2009 J jnl
Statistical analysis of circuit timing using majorization.
Commun. ACM
Michael Orshansky, Wei-Shen Wang
2007 J jnl
Estimation of Leakage Power Consumption and Parametric Yield Based on Realistic Probabilistic Descriptions of Parameters.
J. Low Power Electron.
Wei-Shen Wang, Michael Orshansky
2006 J jnl
Analysis of Leakage Power Reduction in Dual-Vth Technologies in the Presence of Large Threshold Voltage Variation.
J. Low Power Electron.
Wei-Shen Wang, Michael Liu, Michael Orshansky
2006 — conf
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs.
ISQED
Bin Zhang, Wei-Shen Wang, Michael Orshansky
2006 Misc conf
Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer chips.
SAC
Michael Orshansky, Wei-Shen Wang, Martine Ceberio, Gang Xiang
2006 J jnl
Path-Based Statistical Timing Analysis Handling Arbitrary Delay Correlations: Theory and Implementation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wei-Shen Wang, Michael Orshansky
2006 A conf
Robust estimation of parametric yield under limited descriptions of uncertainty.
ICCAD
Wei-Shen Wang, Michael Orshansky
2006 A* conf
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty.
DAC
Wei-Shen Wang, Vladik Kreinovich, Michael Orshansky
2004 A conf
Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation.
ISLPED
Michael Liu, Wei-Shen Wang, Michael Orshansky