| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Int. Trans. Oper. Res.
|
| 2021 | J | jnl |
Int. Trans. Oper. Res.
|
| 2018 | J | jnl |
Oper. Res.
|
| 2014 | J | jnl |
Expert Syst. Appl.
|
| 2014 | J | jnl |
Knowl. Based Syst.
|
| 2014 | J | jnl |
J. Knowl. Manag.
|
| 2014 | J | jnl |
Int. J. Inf. Technol. Decis. Mak.
|
| 2012 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2012 | J | jnl |
J. Electronic Imaging
|
| 2011 | J | jnl |
Knowl. Based Syst.
|
| 2011 | J | jnl |
Int. J. Technol. Manag.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2006 | — | conf |
JCIS
|
| 2005 | J | jnl |
Expert Syst. Appl.
|
| 2005 | J | jnl |
Expert Syst. Appl.
|
| 2005 | J | jnl |
Expert Syst. Appl.
|