Wei-Cheng Lien

19 papers A 1B 1C 1Misc 1Journal 6Unranked 9
YearRankTypeTitle / Venue / Authors
2025 J jnl
A rapid household mite detection and classification technology based on artificial intelligence-enhanced scanned images.
Internet Things
Lydia Hsiao-Mei Lin, Wei-Cheng Lien, Cindy Yu-Ting Cheng, You-Cheng Lee, Yi-Ting Lin, Chin-Chia Kuo, Yi-Ting Lai, Yan-Tsung Peng
2022 — conf
Traffic Violation Detection via Depth and Gradient Angle Change.
ICITE
Yan-Tsung Peng, Chen-Yu Liu, He-Hao Liao, Wei-Cheng Lien, Gee-Sern Jison Hsu
2021 — conf
Unveiling of How Image Restoration Contributes to Underwater Object Detection.
ICCE-TW
Wen-Yi Peng, Yan-Tsung Peng, Wei-Cheng Lien, Chu-Song Chen
2016 A conf
Output bit selection methodology for test response compaction.
ITC
Wei-Cheng Lien, Kuen-Jong Lee
2014 Misc conf
An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model.
VTS
Cheng-Hung Wu, Kuen-Jong Lee, Wei-Cheng Lien
2014 J jnl
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yi-Hua Li, Wei-Cheng Lien, Ing-Chao Lin, Kuen-Jong Lee
2014 J jnl
Efficient LFSR Reseeding Based on Internal-Response Feedback.
J. Electron. Test.
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty
2014 — conf
Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment.
ESSDERC
Shiqian Shao, Wei-Cheng Lien, Ayden Maralani, Albert P. Pisano
2014 — conf
Output selection for test response compaction based on multiple counters.
VLSI-DAT
Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh
2014 B conf
Output-bit selection with X-avoidance using multiple counters for test-response compaction.
ETS
Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh
2013 — conf
A New LFSR Reseeding Scheme via Internal Response Feedback.
Asian Test Symposium
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty
2013 J jnl
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang
2013 J jnl
Counter-Based Output Selection for Test Response Compaction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty, Yu-Hua Wu
2012 — conf
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume.
Asian Test Symposium
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh
2012 C conf
Accumulator-based output selection for test response compaction.
ISCAS
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Shih-Shiun Chien, Krishnendu Chakrabarty
2012 — conf
Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors.
ESSDERC
Wei-Cheng Lien, Albert P. Pisano, Dung-Sheng Tsai, Jr-Hau He, Debbie G. Senesky
2012 — conf
Routing-efficient implementation of an internal-response-based BIST architecture.
VLSI-DAT
Wei-Cheng Lien, Tong-Yu Hsieh, Kuen-Jong Lee
2011 J jnl
Test Response Compaction via Output Bit Selection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh
2010 — conf
A Complete Logic BIST Technology with No Storage Requirement.
Asian Test Symposium
Wei-Cheng Lien, Kuen-Jong Lee