Ward De Ceuninck

19 papers Journal 17Unranked 2
YearRankTypeTitle / Venue / Authors
2018 — conf
Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules.
IRPS
Philippe Nivelle, Tom Borgers, Eszter Voroshazi, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen
2017 J jnl
Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic Receptors.
Sensors
Thijs Vandenryt, Bart van Grinsven, Kasper Eersels, Peter Cornelis, Safira Kholwadia, Thomas Cleij, Ronald Thoelen, Ward De Ceuninck, Marloes Peeters, Patrick H. Wagner
2014 J jnl
Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted Polymers.
Sensors
Gideon Wackers, Thijs Vandenryt, Peter Cornelis, Evelien Kellens, Ronald Thoelen, Ward De Ceuninck, Patricia Losada-Pérez, Bart van Grinsven, Marloes Peeters, Patrick H. Wagner
2013 J jnl
Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface Interactions.
Sensors
Thijs Vandenryt, Andrea Pohl, Bart van Grinsven, Ronald Thoelen, Ward De Ceuninck, Patrick H. Wagner, Jörg Opitz
2013 J jnl
Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection Limits.
Sensors
Bram Geerets, Marloes Peeters, Bart van Grinsven, Karolien Bers, Ward De Ceuninck, Patrick H. Wagner
2012 — conf
Embedded Unit for Point-of-Care Impedance Based Biosensor Readout.
HPCC-ICESS
Jeroen Broeders, Dieter Croux, Ans Weustenraed, Thomas Cleij, Patrick H. Wagner, Ward De Ceuninck, Wouter Vanaken, Stijn Duchateau, Ronald Thoelen
2007 J jnl
Lifetime modeling of intrinsic gate oxide breakdown at high temperature.
Microelectron. Reliab.
R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen
2005 J jnl
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.
Microelectron. Reliab.
Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex
2004 J jnl
Evidence for source side injection hot carrier effects on lateral DMOS transistors.
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot
2004 J jnl
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.
Microelectron. Reliab.
Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger
2003 J jnl
A new method for the analysis of high-resolution SILC data.
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
2003 J jnl
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.
Microelectron. Reliab.
Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne
2002 J jnl
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.
Microelectron. Reliab.
R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
2002 J jnl
High-resolution SILC measurements of thin SiO
Microelectron. Reliab.
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
2002 J jnl
How reliable are reliability tests?
Microelectron. Reliab.
Luc Tielemans, R. Rongen, Ward De Ceuninck
2002 J jnl
Statistical aspects of the degradation of LDD nMOSFETs.
Microelectron. Reliab.
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen
2001 J jnl
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation.
Microelectron. Reliab.
R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken
2001 J jnl
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation.
Microelectron. Reliab.
R. Petersen, Ward De Ceuninck, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons
2001 J jnl
High-resolution in-situ of gold electromigration: test time reduction.
Microelectron. Reliab.
Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel