| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
J. Inf. Sci. Eng.
|
| 2018 | J | jnl |
Integr.
|
| 2018 | — | conf |
DSC
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
MTV
|
| 2012 | — | conf |
MTV
|
| 2012 | — | conf |
MTV
|
| 2010 | J | jnl |
IET Comput. Digit. Tech.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2007 | J | jnl |
Photonic Netw. Commun.
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2007 | — | conf |
MTV
|
| 2006 | J | jnl |
Comput. Commun.
|
| 2002 | — | conf |
APCCAS (1)
|
| 1999 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1997 | — | conf |
ASP-DAC
|
| 1996 | — | conf |
Asian Test Symposium
|