W. S. Lau

12 papers Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2016 J jnl
Effects of thermal annealing on the charge localization characteristics of HfO
Microelectron. Reliab.
Xuan Feng, Shurong Dong, Hei Wong, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau
2016 J jnl
The variation of the leakage current characteristics of W/Ta
Microelectron. Reliab.
Danqun Yu, W. S. Lau, Hei Wong, Xuan Feng, Shurong Dong, Kin Leong Pey
2014 J jnl
An investigation on capacitance-trigger ESD protection devices for high voltage integrated circuits.
Microelectron. Reliab.
Hailian Liang, Weidong Nie, Xiaofeng Gu, Shurong Dong, W. S. Lau
2009 J jnl
Formation of Ohmic contacts in AlGaN/GaN HEMT structures at 500 degreeC by Ohmic contact recess etching.
Microelectron. Reliab.
W. S. Lau, Joy B. H. Tan, B. P. Singh
2008 J jnl
Effect of a trace of water vapor on Ohmic contact formation for AlGaN/GaN epitaxial wafers.
Microelectron. Reliab.
W. S. Lau, W. T. Wong, Joy B. H. Tan, B. P. Singh
2008 J jnl
Shape recovery from turntable sequence using rim reconstruction.
Pattern Recognit.
Huang Zhong, W. S. Lau, W. F. Sze, Y. S. Hung
2007 J jnl
Evidence that N
Microelectron. Reliab.
W. S. Lau, P. W. Qian, Taejoon Han, Nathan P. Sandler, S. T. Che, S. E. Ang, C. H. Tung, T. T. Sheng
2007 — conf
Shape Recovery from Turntable Image Sequence.
ACCV (2)
Huang Zhong, W. S. Lau, W. F. Sze, Y. S. Hung
2001 J jnl
Solid reconstruction from orthographic views using 2-stage extrusion.
Comput. Aided Des.
Simon S. P. Shum, W. S. Lau, Matthew M. F. Yuen, Kai-Ming Yu
2000 J jnl
Thermal stability of MISFET with low-temp molecular-beam epitaxy-grown GaAs and Al
IEEE Trans. Reliab.
R. V. V. V. J. Rao, T. C. Chong, L. S. Tan, W. S. Lau
1998 J jnl
Sun Tzu's as business and management strategies for world class business excellence evaluation under QFD methodology.
Bus. Process. Manag. J.
S. F. Lee, P. Roberts, W. S. Lau, S. K. Bhattacharyya
1997 J jnl
Solid reconstruction from orthographic opaque views using incremental extrusion.
Comput. Graph.
Simon S. P. Shum, W. S. Lau, Matthew Ming-Fai Yuen, Kai-Ming Yu