| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
J. Electron. Test.
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | — | conf |
ENC
|
| 2025 | — | conf |
LATS
|
| 2024 | J | jnl |
J. Electron. Test.
|
| 2024 | — | conf |
LATS
|
| 2023 | — | conf |
LATS
|
| 2023 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2022 | — | conf |
LATS
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2020 | — | conf |
LATS
|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
LATS
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | B | conf |
ETS
|
| 2019 | — | conf |
LATS
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | — | conf |
LATS
|
| 2018 | C | conf |
VLSI-SoC
|
| 2018 | — | conf |
VLSI-SoC (Selected Papers)
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | C | conf |
VLSI-SoC
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2017 | — | conf |
LATS
|
| 2016 | — | conf |
LATS
|
| 2016 | B | conf |
ETS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
J. Low Power Electron.
|
| 2015 | C | conf |
VLSI-SoC
|
| 2015 | Misc | conf |
VTS
|
| 2015 | C | conf |
VLSI-SoC
|
| 2015 | — | conf |
LATS
|
| 2015 | — | conf |
LATS
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2015 | — | conf |
LATS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | Misc | conf |
VTS
|
| 2014 | — | conf |
LATW
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2013 | — | conf |
LATW
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | — | conf |
LATW
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | Misc | conf |
VTS
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | J | jnl |
J. Low Power Electron.
|
| 2011 | Misc | conf |
VTS
|
| 2011 | Misc | conf |
VTS
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | B | conf |
ETS
|
| 2010 | Misc | conf |
VTS
|
| 2010 | C | conf |
IOLTS
|
| 2010 | A | conf |
DATE
|
| 2010 | — | conf |
LATW
|
| 2009 | — | conf |
LATW
|
| 2009 | C | conf |
IOLTS
|
| 2009 | C | conf |
IOLTS
|
| 2009 | Misc | conf |
VTS
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | C | conf |
ISCAS
|
| 2008 | — | conf |
ISVLSI
|
| 2007 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
DFT
|
| 2005 | B | conf |
ETS
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | B | conf |
ETS
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | — | conf |
ETW
|
| 2002 | — | conf |
ISCAS (4)
|
| 2002 | — | conf |
LATW
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | — | conf |
LATW
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
LATW
|
| 2000 | J | jnl |
ACM SIGCSE Bull.
|
| 2000 | Misc | conf |
VTS
|
| 2000 | — | conf |
LATW
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1998 | — | conf |
SBCCI
|
| 1998 | Misc | conf |
VTS
|
| 1997 | J | jnl |
VLSI Design
|
| 1995 | Misc | conf |
VTS
|
| 1994 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1993 | — | conf |
DFT
|
| 1992 | J | jnl |
J. Electron. Test.
|
| 1991 | A | conf |
ITC
|