Vyacheslav N. Yarmolik

34 papers A 5B 1C 2Misc 3Journal 14Unranked 9
YearRankTypeTitle / Venue / Authors
2022 J jnl
Universal Address Sequence Generator for Memory Built-in Self-test.
CoRR
Ireneusz Mrozek, Nikolai A. Shevchenko, Vyacheslav N. Yarmolik
2022 J jnl
Universal Address Sequence Generator for Memory Built-in Self-test.
Fundam. Informaticae
Ireneusz Mrozek, Nikolai A. Shevchenko, Vyacheslav N. Yarmolik
2021 J jnl
Transparent Memory Tests Based on the Double Address Sequences.
Entropy
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2018 — conf
Multi-Run March Tests for Pattern Sensitive Faults in RAM.
EWDTS
Eugenia Buslowska, Vyacheslav N. Yarmolik
2018 — conf
Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation.
EWDTS
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2017 — conf
Optimal Controlled Random Tests.
CISIM
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2017 J jnl
Two-Run RAM March Testing with Address Decimation.
J. Circuits Syst. Comput.
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2016 — conf
Methods of Synthesis of Controlled Random Tests.
CISIM
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2016 J jnl
Multiple Controlled Random Testing.
Fundam. Informaticae
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2015 J jnl
Controlled method of random test synthesis.
Autom. Control. Comput. Sci.
Vyacheslav N. Yarmolik, Ireneusz Mrozek, Svetlana V. Yarmolik
2014 J jnl
Address sequences.
Autom. Control. Comput. Sci.
Vyacheslav N. Yarmolik, Svetlana V. Yarmolik
2012 J jnl
Antirandom Test Vectors for BIST in Hardware/Software Systems.
Fundam. Informaticae
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2012 J jnl
Iterative Antirandom Testing.
J. Electron. Test.
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2010 J jnl
Generalized adaptive signature analysis.
Autom. Control. Comput. Sci.
S. V. Yarmolik, Vyacheslav N. Yarmolik
2008 — conf
Multi Background Memory Testing.
CISIM
Ireneusz Mrozek, Vyacheslav N. Yarmolik, Eugenia Buslowska
2008 C conf
Optimal Backgrounds Selection for Multi Run Memory Testing.
DDECS
Ireneusz Mrozek, Vyacheslav N. Yarmolik
2007 C conf
Multiple Errors Detection Technique for RAM.
DDECS
Sergei B. Musin, Alexander A. Ivaniuk, Vyacheslav N. Yarmolik
2007 — conf
Obfuscation as Intellectual Rights Protection in VHDL Language.
CISIM
Maciej Brzozowski, Vyacheslav N. Yarmolik
2002 J jnl
Efficient Online and Offline Testing of Embedded DRAMs.
IEEE Trans. Computers
Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik
1999 Misc conf
Error Detecting Refreshment for Embedded DRAMs.
VTS
Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik
1999 A conf
Symmetric Transparent BIST for RAMs.
DATE
Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik
1999 Misc conf
Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.
EDCC
Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich
1998 — conf
BIST Module for Mixed-Signal Circuits.
DFT
Serge N. Demidenko, Vincenzo Piuri, Vyacheslav N. Yarmolik, A. Shmidman
1998 — conf
March PS(23N) Test for DRAM Pattern-Sensitive Faults.
Asian Test Symposium
Vyacheslav N. Yarmolik, Yuri V. Klimets, Serge N. Demidenko
1998 A conf
Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs.
DATE
Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich
1997 — conf
March LA: a test for linked memory faults.
ED&TC
Ad J. van de Goor, Georgi Gaydadjiev, Vyacheslav N. Yarmolik, V. G. Mikitjuk
1996 Misc conf
March LR: a test for realistic linked faults.
VTS
Ad J. van de Goor, Georgi Gaydadjiev, V. G. Mikitjuk, Vyacheslav N. Yarmolik
1996 J jnl
Transparent random access memory testing for pattern sensitive faults.
J. Electron. Test.
Mark G. Karpovsky, Vyacheslav N. Yarmolik
1995 A conf
Exact Aliasing Computation for RAM BIST.
ITC
O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik
1994 A conf
Aliasing-free Signature Analysis for RAM BIST.
ITC
Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi
1994 B conf
Signature Testability of PLA.
FPL
E. P. Kalosha, Vyacheslav N. Yarmolik, Mark G. Karpovsky
1994 A conf
Transparent Memory Testing for Pattern-Sensitive Faults.
ITC
Mark G. Karpovsky, Vyacheslav N. Yarmolik
1994 J jnl
Zero aliasing ROM BIST.
J. Electron. Test.
O. Kebichi, Vyacheslav N. Yarmolik, Michael Nicolaidis
1983 J jnl
Generator of randomized pseudorandom numbers.
Kybernetika
Jan Havel, A. N. Morozevich, Vyacheslav N. Yarmolik