Vojkan Davidovic

21 papers Journal 21
YearRankTypeTitle / Venue / Authors
2025 J jnl
Impact of Trapped Charge on the Breakdown Phenomena in HfO
J. Circuits Syst. Comput.
Dencho Spassov, Albena Paskaleva, E. Guziewicz, Tz. Ivanov, T. Stanchev, Vojkan Davidovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic
2022 J jnl
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.
J. Circuits Syst. Comput.
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
2018 J jnl
A review of pulsed NBTI in P-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Ninoslav Stojadinovic
2018 J jnl
NBTI and irradiation related degradation mechanisms in power VDMOS transistors.
Microelectron. Reliab.
Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic
2013 J jnl
Nanoelectronic Devices, B.-G. Park, S.W. Hwang, Y.J. Park. Pan Stanford Publishing Pte. Ltd., Singapore (2012). 406 p., ISBN: 978-981-4364-00-3.
Microelectron. Reliab.
Vojkan Davidovic
2012 J jnl
Reliability Physics and Engineering: Time-to-Failure Modeling, J.W. McPherson. Springer (2010). 318 pp., ISBN: 978-1-4419-6347-5.
Microelectron. Reliab.
Vojkan Davidovic
2011 J jnl
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic
2010 J jnl
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic
2009 J jnl
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.
Microelectron. Reliab.
Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.
IET Circuits Devices Syst.
Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic
2008 J jnl
Negative bias temperature instability in n-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2007 J jnl
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab.
Vojkan Davidovic, Dimitrios N. Kouvatsos, Ninoslav Stojadinovic, Apostolos T. Voutsas
2007 J jnl
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic
2006 J jnl
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.
Microelectron. Reliab.
Danijel Dankovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2005 J jnl
Effects of electrical stressing in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Vojkan Davidovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Sima Dimitrijev
2005 J jnl
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Danijel Dankovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Ivica Manic, Snezana Golubovic
2004 J jnl
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab.
Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
2003 J jnl
Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.
Microelectron. Reliab.
Snezana Djoric-Veljkovic, Ivica Manic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic
2002 J jnl
Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev
2002 J jnl
Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Sima Dimitrijev
2001 J jnl
Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs.
Microelectron. Reliab.
Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev