Vladimír Székely

29 papers A* 1A 3C 1Misc 2Journal 17Unranked 5
YearRankTypeTitle / Venue / Authors
2015 J jnl
Transformation between linear network features in convolution approach.
Int. J. Circuit Theory Appl.
Vladimír Székely, Albin Szalai
2012 J jnl
Measurement of the time-constant spectrum: Systematic errors, correction.
Microelectron. J.
Vladimír Székely, Albin Szalai
2012 J jnl
Possible acception criteria for structure functions.
Microelectron. J.
Albin Szalai, Vladimír Székely
2010 J jnl
Editorial.
Microelectron. J.
Vladimír Székely, Clemens J. M. Lasance
2010 J jnl
Evaluation of short pulse and short time thermal transient measurements.
Microelectron. J.
Vladimír Székely
2010 J jnl
Fast field solver for the simulation of large-area OLEDs.
Microelectron. J.
László Pohl, Zsolt Kohári, Vladimír Székely
2008 J jnl
Characterization and Modeling of an Electro-thermal MEMS Structure
CoRR
Péter G. Szabó, Vladimír Székely
2008 J jnl
Contactless Thermal Characterization of High Temperature Test Chamber
CoRR
Zoltán Szucs, György Bognár, Vladimír Székely, Márta Rencz
2007 J jnl
Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array
CoRR
György Bognár, Vladimír Székely, Márta Rencz
2006 C conf
Die Attach Quality Testing by Fully Contact-less Measurement Method.
DDECS
György Bognár, Gyula Horváth, Zoltán Szucs, Vladimír Székely
2004 J jnl
Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03).
Microelectron. J.
Vladimír Székely
2003 A conf
A Fast Algorithm for the Layout Based Electro-Thermal Simulation.
DATE
Márta Rencz, Vladimír Székely, András Poppe
2002 J jnl
Enhancing reliability with thermal transient testing.
Microelectron. Reliab.
Vladimír Székely
2000 J jnl
IDDQ Testing of Submicron CMOS - by Cooling?
J. Electron. Test.
Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois
1999 Misc conf
Design and Test of MEMs.
VLSI Design
Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1998 A conf
Fast Field Solvers for Thermal and Electrostatic Analysis.
DATE
Vladimír Székely, Márta Rencz
1998 J jnl
Thermal Monitoring of Self-Checking Systems.
J. Electron. Test.
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1998 J jnl
Tracing the Thermal Behavior of ICs.
IEEE Des. Test Comput.
Vladimír Székely, Márta Rencz, Bernard Courtois
1997 A* conf
CAD and Foundries for Microsystems.
DAC
Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, Paul Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1997 J jnl
CMOS sensors for on-line thermal monitoring of VLSI circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Vladimír Székely, Cs. Márta, Zsolt Kohári, Márta Rencz
1997 J jnl
Electro-thermal and logi-thermal simulation of VLSI designs.
IEEE Trans. Very Large Scale Integr. Syst.
Vladimír Székely, András Poppe, Andras Pahi, Alpar Csendes, G. Hajas, Márta Rencz
1997 A conf
Fast field solver-programs for thermal and electrostatic analysis of microsystem elements.
ICCAD
Vladimír Székely, Márta Rencz
1997 Misc conf
Integrating on-chip temperature sensors into DfT schemes and BIST architectures.
VTS
Vladimír Székely, Márta Rencz, Bernard Courtois
1997 — conf
SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells.
ED&TC
Vladimír Székely, Andras Pahi, András Poppe, Márta Rencz, Alpar Csendes
1996 — conf
An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework.
ED&TC
Vladimír Székely, András Poppe, Márta Rencz, Gabor Farkas, Alpar Csendes, Andras Pahi
1996 — conf
Applied design and analysis of microsystems.
ED&TC
Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely
1996 — conf
Thermal Monitoring Of Safety-Critical Integrated Systems.
Asian Test Symposium
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1995 — conf
Thermal test and monitoring [microelectronic structures].
ED&TC
Vladimír Székely, Márta Rencz
1993 J jnl
Image recognition problems of fingerprint identification.
Microprocess. Microsystems
Éva Nikodémusz-Székely, Vladimír Székely