| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | — | conf |
ICAART (3)
|
| 2026 | — | conf |
LATS
|
| 2026 | — | conf |
LATS
|
| 2026 | — | conf |
ICAART (1)
|
| 2026 | J | jnl |
Toxicbias-reasoning: a multicultural dataset for social bias detection with human-aligned reasoning.
Lang. Resour. Evaluation
|
| 2025 | C | conf |
ISCAS
|
| 2025 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2025 | C | conf |
SECRYPT
|
| 2025 | J | jnl |
Comput. Mater. Continua
|
| 2025 | C | conf |
IOLTS
|
| 2025 | C | conf |
VLSI-SoC
|
| 2025 | Misc | conf |
VLSID
|
| 2025 | — | conf |
SOCC
|
| 2025 | C | conf |
ISCAS
|
| 2025 | C | conf |
SECRYPT
|
| 2025 | C | conf |
SECRYPT
|
| 2025 | C | conf |
SBAC-PAD
|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
IJCNLP-AACL (long papers)
|
| 2025 | — | conf |
ATS
|
| 2024 | J | jnl |
Clust. Comput.
|
| 2024 | J | jnl |
Parallel Process. Lett.
|
| 2024 | J | jnl |
Comput. Secur.
|
| 2024 | C | conf |
SIN
|
| 2024 | J | jnl |
Pattern Recognit. Lett.
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | — | conf |
ICAART (2)
|
| 2024 | Misc | conf |
ICISS
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | — | conf |
EWDTS
|
| 2024 | C | conf |
SBAC-PAD
|
| 2024 | — | conf |
MEMSYS
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | C | conf |
DDECS
|
| 2024 | — | conf |
EWDTS
|
| 2023 | — | conf |
DFT
|
| 2023 | C | conf |
IOLTS
|
| 2023 | — | conf |
LATS
|
| 2023 | — | conf |
DFT
|
| 2023 | C | conf |
IOLTS
|
| 2023 | — | conf |
iSES
|
| 2023 | — | conf |
ATS
|
| 2023 | — | conf |
LATS
|
| 2023 | Misc | conf |
ICISS
|
| 2023 | C | conf |
IOLTS
|
| 2023 | — | conf |
SOSE
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2022 | — | conf |
VDAT
|
| 2022 | Misc | conf |
VTS
|
| 2022 | C | conf |
SECRYPT
|
| 2022 | — | conf |
ISVLSI
|
| 2022 | — | conf |
VDAT
|
| 2022 | — | conf |
VDAT
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2021 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2021 | C | conf |
ISCAS
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | — | conf |
MWSCAS
|
| 2021 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2021 | — | conf |
ANTS
|
| 2020 | Misc | conf |
VLSID
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | B | conf |
ISPASS
|
| 2020 | — | conf |
ATS
|
| 2020 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | C | conf |
ICCD
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | — | conf |
ATS
|
| 2019 | — | conf |
DFT
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | C | conf |
IOLTS
|
| 2019 | — | ed. |
ISEA-ISAP
|
| 2019 | J | jnl |
IET Comput. Digit. Tech.
|
| 2019 | — | conf |
ISQED
|
| 2019 | — | ed. |
VDAT
|
| 2019 | — | ed. |
VDAT
|
| 2019 | — | conf |
ATS
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
IGSC
|
| 2018 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2018 | A | conf |
DATE
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
MEMSYS
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | — | conf |
EWDTS
|
| 2017 | Misc | conf |
VLSID
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
EWDTS
|
| 2017 | B | conf |
ETS
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | C | conf |
ICCD
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | A | conf |
ITC
|
| 2017 | — | conf |
LATS
|
| 2017 | C | conf |
VLSI-SoC
|
| 2017 | Misc | ed. |
ICISS
|
| 2017 | C | conf |
IOLTS
|
| 2017 | — | conf |
ATS
|
| 2017 | Misc | conf |
VLSID
|
| 2017 | — | conf |
EWDTS
|
| 2017 | — | conf |
LATS
|
| 2017 | — | conf |
DFT
|
| 2017 | — | conf |
DFT
|
| 2017 | — | conf |
HLDVT
|
| 2017 | C | conf |
IOLTS
|
| 2017 | C | conf |
IOLTS
|
| 2017 | — | conf |
LATS
|
| 2017 | — | ed. |
VDAT
|
| 2016 | C | conf |
IOLTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | — | conf |
EWDTS
|
| 2016 | C | conf |
IOLTS
|
| 2016 | — | conf |
EWDTS
|
| 2015 | — | conf |
ATS
|
| 2015 | — | conf |
ATS
|
| 2015 | — | conf |
ATS
|
| 2015 | C | conf |
ICCD
|
| 2015 | — | conf |
VDAT
|
| 2014 | — | conf |
EAIS
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | — | conf |
EWDTS
|
| 2014 | — | conf |
EWDTS
|
| 2013 | — | conf |
EWDTS
|
| 2013 | J | jnl |
Detection of false paths in logical circuits by joint analysis of the AND/OR trees and SSBDD-graphs.
Autom. Remote. Control.
|
| 2013 | — | conf |
VDAT
|
| 2013 | — | conf |
EWDTS
|
| 2013 | — | conf |
EWDTS
|
| 2013 | — | conf |
EWDTS
|
| 2013 | — | conf |
3DIC
|
| 2013 | Misc | conf |
VLSI Design
|
| 2013 | — | ed. |
VDAT
|
| 2012 | C | ed. |
SIN
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | Misc | conf |
VTS
|
| 2012 | C | conf |
SIN
|
| 2012 | — | conf |
VDAT
|
| 2012 | C | conf |
ISCAS
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | — | conf |
VDAT
|
| 2012 | C | conf |
IOLTS
|
| 2011 | C | conf |
ICCD
|
| 2011 | C | conf |
VLSI-SoC
|
| 2011 | — | conf |
DELTA
|
| 2011 | — | conf |
Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization.
DSN Workshops
|
| 2011 | Misc | conf |
Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients.
VTS
|
| 2011 | C | conf |
HPCC
|
| 2011 | C | conf |
IOLTS
|
| 2011 | — | conf |
ISQED
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | — | conf |
EWDTS
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | — | conf |
LATW
|
| 2011 | — | conf |
SoCC
|
| 2010 | A | conf |
DSN
|
| 2010 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2010 | — | conf |
DELTA
|
| 2010 | — | conf |
EWDTS
|
| 2010 | — | conf |
EWDTS
|
| 2010 | C | conf |
ISCAS
|
| 2010 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | B | conf |
ETS
|
| 2010 | A | conf |
DATE
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | — | conf |
EWDTS
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | — | conf |
EWDTS
|
| 2010 | C | conf |
IOLTS
|
| 2010 | — | conf |
FPT
|
| 2010 | B | conf |
ETS
|
| 2010 | C | conf |
ISCAS
|
| 2010 | — | conf |
EWDTS
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2009 | A | conf |
DATE
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | B | conf |
ETS
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2005 | — | conf |
ISCAS (6)
|
| 2005 | B | conf |
FPL
|
| 2004 | Misc | conf |
VLSI Design
|
| 2003 | — | conf |
Asian Test Symposium
|