| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
J. Vis.
|
| 2007 | J | jnl |
J. Vis.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 1999 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | J | jnl |
IEEE Des. Test Comput.
|
| 1997 | A | conf |
ICCAD
|
| 1996 | A | conf |
ICCAD
|
| 1996 | A | conf |
ICCAD
|
| 1992 | J | jnl |
J. Electron. Test.
|
| 1989 | A* | conf |
DAC
|
| 1988 | A | conf |
ITC
|