Vincenzo Tancorre

34 papers A 4B 2C 5Misc 3Journal 10Unranked 10

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs. IEEE Trans. Computers Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi
2025	J	`jnl`	A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. IEEE Trans. Computers Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre
2025	J	`jnl`	A Novel Indirect Methodology Based on Execution Traces for Grading Functional Test Programs. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, Stefano Quer, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	A System-Level Test Methodology for Communication Peripherals in System-on-Chips. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre
2025	J	`jnl`	Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. IEEE Trans. Computers Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	—	`conf`	Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. LATS Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025	—	`conf`	Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. LATS Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre
2024	—	`conf`	A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. DFT Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre
2023	J	`jnl`	A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	J	`jnl`	A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023	Misc	`conf`	A guided debugger-based fault injection methodology for assessing functional test programs. VTS Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	C	`conf`	About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2023	C	`conf`	Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023	—	`conf`	On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
2022	—	`conf`	A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022	—	`conf`	A novel SEU injection setup for Automotive SoC. ISIE Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	A	`conf`	An innovative Strategy to Quickly Grade Functional Test Programs. ITC Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	A	`conf`	In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ITC Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022	—	`conf`	Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022	J	`jnl`	Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2022	B	`conf`	Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli
2021	C	`conf`	Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
2021	—	`conf`	Innovative methods for Burn-In related Stress Metrics Computation. DTIS Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
2019	C	`conf`	Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi
2011	C	`conf`	Optimized embedded memory diagnosis. DDECS Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
2006	A	`conf`	Embedded Memory Diagnosis: An Industrial Workflow. ITC Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2006	Misc	`conf`	On the Automation of the Test Flow of Complex SoCs. VTS Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
2004	J	`jnl`	A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2004	J	`jnl`	Understanding Yield Losses in Logic Circuits. IEEE Des. Test Comput. Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
2004	Misc	`conf`	Yield Analysis of Logic Circuits. VTS Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
2003	A	`conf`	Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
2002	—	`conf`	A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
2002	—	`conf`	A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda