Vincenzo d'Alessandro

21 papers Journal 15Unranked 5
YearRankTypeTitle / Venue / Authors
2024 — conf
Enhancing Electrical Ruggedness in Double-Sided Cooled Power Modules.
PRIME
Ciro Scognamillo, Antonio Pio Catalano, Lorenzo Codecasa, Alberto Castellazzi, Vincenzo d'Alessandro
2023 — conf
Improving Performance of InGaP/GaAs HBT Arrays by means of Temperature-Dependent Base Ballasting Resistors.
PRIME
Ciro Scognamillo, Antonio Pio Catalano, Vincenzo d'Alessandro, Peter J. Zampardi, Kerry Burger
2022 — conf
Defect Detection in Double-Sided Cooled Power Modules by Structure Functions.
PRIME
Ciro Scognamillo, Antonio Pio Catalano, Vincenzo d'Alessandro, Lorenzo Codecasa, Alberto Castellazzi
2022 J jnl
Investigating the Impact of Cracks on Solar Cells Performance: Analysis Based on Nonuniform and Uniform Crack Distributions.
IEEE Trans. Ind. Informatics
Mahmoud Dhimish, Vincenzo d'Alessandro, Santolo Daliento
2018 J jnl
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization.
Microelectron. Reliab.
Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi
2018 J jnl
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources.
Microelectron. Reliab.
Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2017 J jnl
3-D thermal models calibration by parametric dynamic compact thermal models.
Microelectron. Reliab.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2017 — conf
Model-Order Reduction Procedure for Fast Dynamic Electrothermal Simulation of Power Converters.
ApplePies
Antonio Pio Catalano, Michele Riccio, Lorenzo Codecasa, Alessandro Magnani, Gianpaolo Romano, Vincenzo d'Alessandro, Luca Maresca, Nils Rinaldi, Giovanni Breglio, Andrea Irace
2017 J jnl
Partition-based approach to parametric dynamic compact thermal modeling.
Microelectron. Reliab.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi, Andre G. Metzger, Robin Bornoff, John Parry
2017 J jnl
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications.
Proc. IEEE
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
2017 J jnl
Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies.
Microelectron. Reliab.
Vincenzo d'Alessandro, Antonio Pio Catalano, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Brian Moser, Peter J. Zampardi
2016 J jnl
Advanced thermal simulation of SiGe: C HBTs including back-end-of-line.
Microelectron. Reliab.
Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger
2015 J jnl
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab.
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
2015 J jnl
Structure-preserving approach to multi-port dynamic compact models of nonlinear heat conduction.
Microelectron. J.
Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolò Rinaldi
2014 J jnl
3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions.
Microelectron. Reliab.
Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy
2013 J jnl
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations.
Microelectron. Reliab.
Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace
2013 — conf
Dynamic electrothermal macromodeling techniques for thermal-aware design of circuits and systems.
PATMOS
Alessandro Magnani, Vincenzo d'Alessandro, Niccolò Rinaldi, Massimiliano de Magistris, Klaus Aufinger
2013 J jnl
Evaluation of thermal balancing techniques in InGaP/GaAs HBT power arrays for wireless handset power amplifiers.
Microelectron. Reliab.
Andre G. Metzger, Vincenzo d'Alessandro, Niccolò Rinaldi, Peter J. Zampardi
2012 J jnl
Influence of charge balance on the robustness of trench-based super junction diodes.
Microelectron. Reliab.
Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Jaume Roig, David Flores, Peter Moens
2004 J jnl
Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors.
IEEE J. Solid State Circuits
Nebojsa Nenadovic, Slobodan Mijalkovic, Lis K. Nanver, Lode K. J. Vandamme, Vincenzo d'Alessandro, Hugo Schellevis, Jan W. Slotboom
2002 — —
Analysis of electro-thermal effects in semiconductor devices.
Vincenzo d'Alessandro