Vincent Pouget

33 papers C 3Journal 24Unranked 6

Year	Rank	Type	Title / Venue / Authors
2020	—	`conf`	Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed
2020	—	`conf`	Effect of Temperature on Single Event Latchup Sensitivity. DTIS S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
2019	J	`jnl`	Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection. J. Electron. Test. Gennaro Severino Rodrigues, Ádria Barros de Oliveira, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
2018	J	`jnl`	Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget
2018	—	`conf`	Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods. SBCCI Fabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech
2018	—	`conf`	Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection. LATS Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
2018	C	`conf`	Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications. IOLTS Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
2017	J	`jnl`	A calculation method to estimate single event upset cross section. Microelectron. Reliab. Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné
2017	J	`jnl`	Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
2013	J	`jnl`	Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis
2013	J	`jnl`	Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
2012	J	`jnl`	Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
2012	J	`jnl`	Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
2011	J	`jnl`	Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis
2009	J	`jnl`	Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
2009	J	`jnl`	Net integrity checking by optical localization techniques. Microelectron. Reliab. Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget
2008	C	`conf`	Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
2008	J	`jnl`	Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
2007	J	`jnl`	Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results. Microelectron. Reliab. V. Maingot, Jean Baptiste Ferron, Régis Leveugle, Vincent Pouget, Alexandre Douin
2006	J	`jnl`	Application of various optical techniques for ESD defect localization. Microelectron. Reliab. Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2006	J	`jnl`	Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
2005	J	`jnl`	Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
2005	C	`conf`	Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
2004	J	`jnl`	Dynamic behavior of a chemical sensor for humidity level measurement in human breath. IEEE Trans. Instrum. Meas. Angie Tetelin, Vincent Pouget, Jean-Luc Lachaud, Claude Pellet
2004	J	`jnl`	Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. Vincent Pouget, Dean Lewis, Pascal Fouillat
2003	J	`jnl`	A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003	J	`jnl`	Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
2003	J	`jnl`	From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
2003	J	`jnl`	Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2002	—	`conf`	Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW Dean Lewis, Pascal Fouillat, Vincent Pouget
2001	J	`jnl`	Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
2001	J	`jnl`	Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
2000	—	`conf`	An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet