Vincent O'Brien

20 papers A 1C 3Journal 9Unranked 7
YearRankTypeTitle / Venue / Authors
2025 J jnl
Zero-shot Learning for Subdiscrimination in Pre-trained Models.
J. Univers. Comput. Sci.
Francisco Domínguez-Mateos, Vincent O'Brien, James Garland, Ryan Furlong, Daniel Palacios-Alonso
2022 J jnl
Deep Learning and Entropy-Based Texture Features for Color Image Classification.
Entropy
Emma Lhermitte, Mirvana Hilal, Ryan Furlong, Vincent O'Brien, Anne Humeau-Heurtier
2021 C conf
A Higher-Order Programmable Amplitude and Timing Error Shaping Bandpass DEM for Nyquist-Rate D/A Converters.
ISCAS
Shantanu Mehta, Brendan Mullane, Vincent O'Brien, Roberto Pelliconi, Christophe Erdmann
2021 J jnl
Comparison of High-Order Programmable Mismatch Shaping Bandpass DEM Implementations Applicable to Nyquist-Rate D/A Converters.
IEEE Open J. Circuits Syst.
Shantanu Mehta, Roberto Pelliconi, Christophe Erdmann, Vincent O'Brien, Brendan Mullane
2021 J jnl
Metric Embedding Sub-discrimination Study.
CoRR
Ryan Furlong, Vincent O'Brien, James Garland, Francisco Domínguez-Mateos
2021 J jnl
Parameter Analysis of Multiscale Two-Dimensional Fuzzy and Dispersion Entropy Measures Using Machine Learning Classification.
Entropy
Ryan Furlong, Mirvana Hilal, Vincent O'Brien, Anne Humeau-Heurtier
2020 — conf
A Wideband 6th Order Programmable Bandpass DEM Implementation for a Nyquist DAC.
ICECS
Shantanu Mehta, Brendan Mullane, Vincent O'Brien, Roberto Pelliconi, Christophe Erdmann
2020 J jnl
Analysis and Design of a Tri-Level Current-Steering DAC With 12-Bit Linearity and Improved Impedance Matching Suitable for CT-ADCs.
IEEE Open J. Circuits Syst.
Shantanu Mehta, Daniel O'Hare, Vincent O'Brien, Eric Thompson, Brendan Mullane
2020 J jnl
High Order Mismatch Shaping for Low Oversampling Rates.
IEEE Trans. Circuits Syst. II Express Briefs
Vincent O'Brien, Brendan Mullane
2018 J jnl
A Reduced Hardware ISI and Mismatch Shaping DEM Decoder.
Circuits Syst. Signal Process.
Vincent O'Brien, Anthony G. Scanlan, Brendan Mullane
2018 — conf
An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test.
MWSCAS
Brendan Mullane, Vincent O'Brien
2018 J jnl
Correction to: A Reduced Hardware ISI and Mismatch Shaping DEM Decoder.
Circuits Syst. Signal Process.
Vincent O'Brien, Anthony G. Scanlan, Brendan Mullane
2013 — conf
Experimental validation of DAC with nested bus-splitting EFM4 DDSM.
ECCTD
Hongjia Mo, Michael Peter Kennedy, Vincent O'Brien, Brendan Mullane
2011 — conf
A 100dB SFDR 0.5V pk-pk Band-Pass DAC Implemented on a Low Voltage CMOS Process.
VLSI-SoC (Selected Papers)
Brendan Mullane, Vincent O'Brien
2011 C conf
A high performance band-pass DAC architecture and design targeting a low voltage silicon process.
VLSI-SoC
Brendan Mullane, Vincent O'Brien
2011 — conf
High order mismatch noise shaping for bandpass DACs.
ICECS
Vincent O'Brien, Brendan Mullane
2009 — conf
A prototype platform for system-on-chip ADC test and measurement.
SoCC
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
2009 A conf
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis.
ITC
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
2009 C conf
An SOC platform for ADC test and measurement.
DDECS
Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann
2009 — conf
An on-chip solution for static ADC test and measurement.
ACM Great Lakes Symposium on VLSI
Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann