Vijay Reddy

21 papers A 2Journal 6Unranked 13
YearRankTypeTitle / Venue / Authors
2025 — conf
Positive Bias Temperature Instability in Polysilicon/SiO2 PMOS Transistors for Analog High Precision Applications.
IRPS
Dhanoop Varghese, Vijaya Vemuri, Arif Sonnet, Vijay Reddy, Srikanth Krishnan, Vivek Varier, Cheuk Yu, Srinivas Pulijala
2024 — conf
A Comprehensive Survey of Innovative Methodologies in Mobile Ad Hoc Networks (MANET).
ICIMMI
Shruti Thapar, Vivek Saxena, Ravinder Singh Maan, Vijay Reddy, Uday Pratap Singh
2022 — conf
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
IRPS
Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy
2021 — conf
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.
IRPS
Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam
2020 — conf
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.
IRPS
Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam
2019 — conf
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.
IRPS
Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy
2018 — conf
All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits.
IRPS
Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy
2016 J jnl
Controlling Aging in Timing-Critical Paths.
IEEE Des. Test
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy
2014 — conf
Asymmetric aging of clock networks in power efficient designs.
ISQED
Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy
2014 J jnl
Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators.
ACM J. Emerg. Technol. Comput. Syst.
Haldun Küflüoglu, Cathy Chancellor, Min Chen, Claude Cirba, Vijay Reddy
2014 J jnl
Reliability improvement of logic and clock paths in power-efficient designs.
ACM J. Emerg. Technol. Comput. Syst.
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen
2013 A conf
A design-for-reliability approach based on grading library cells for aging effects.
ITC
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
2013 — conf
ACE: A robust variability and aging sensor for high-k/metal gate SoC.
ESSDERC
Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao
2013 — conf
Performance entitlement by exploiting transistor's BTI recovery.
ISQED
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli
2012 J jnl
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors.
IEEE Des. Test Comput.
Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao
2009 — conf
Circuit aging prediction for low-power operation.
CICC
Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
2008 — conf
Statistical prediction of circuit aging under process variations.
CICC
Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao
2007 — conf
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.
CICC
Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao
2006 J jnl
Gate oxide failures due to anomalous stress from HBM ESD testers.
Microelectron. Reliab.
Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline
2005 J jnl
Impact of negative bias temperature instability on digital circuit reliability.
Microelectron. Reliab.
Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan
2004 A conf
Impact of Negative Bias Temperature Instability on Product Parametric Drift.
ITC
Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess