| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Integr.
|
| 2025 | C | conf |
DDECS
|
| 2024 | C | conf |
DDECS
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
AFRICON
|
| 2023 | — | conf |
MIXDES
|
| 2023 | — | conf |
MIPRO
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2022 | C | conf |
DDECS
|
| 2022 | — | conf |
MIPRO
|
| 2022 | — | conf |
MECO
|
| 2022 | — | conf |
RADIOELEKTRONIKA
|
| 2022 | C | conf |
DDECS
|
| 2021 | C | conf |
DDECS
|
| 2021 | — | conf |
AFRICON
|
| 2021 | C | conf |
Enhanced Reliability of Fully Differential Difference Amplifier Through On-chip Digital Calibration.
DDECS
|
| 2021 | — | conf |
MIPRO
|
| 2021 | — | conf |
MIXDES
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Sensors
|
| 2020 | — | ed. |
RADIOELEKTRONIKA
|
| 2020 | — | conf |
MIXDES
|
| 2020 | — | conf |
RADIOELEKTRONIKA
|
| 2020 | — | conf |
RADIOELEKTRONIKA
|
| 2020 | C | conf |
DDECS
|
| 2020 | — | conf |
RADIOELEKTRONIKA
|
| 2020 | — | conf |
MIPRO
|
| 2020 | J | jnl |
Microprocess. Microsystems
|
| 2020 | — | conf |
MECO
|
| 2019 | — | conf |
MECO
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | C | conf |
DDECS
|
| 2019 | A | conf |
ITC
|
| 2019 | C | conf |
DDECS
|
| 2019 | C | conf |
DDECS
|
| 2019 | — | conf |
AFRICON
|
| 2019 | — | conf |
MIXDES
|
| 2019 | C | conf |
DDECS
|
| 2019 | — | conf |
MIPRO
|
| 2018 | C | conf |
DSD
|
| 2018 | — | conf |
DTIS
|
| 2018 | — | conf |
MIPRO
|
| 2018 | C | conf |
DDECS
|
| 2018 | C | conf |
DDECS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | C | conf |
DDECS
|
| 2018 | C | conf |
DDECS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | — | conf |
MECO
|
| 2017 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | — | conf |
AFRICON
|
| 2017 | C | conf |
DDECS
|
| 2017 | C | conf |
DDECS
|
| 2016 | C | conf |
DDECS
|
| 2016 | C | conf |
DDECS
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | C | conf |
DDECS
|
| 2016 | C | conf |
DSD
|
| 2016 | C | conf |
DDECS
|
| 2016 | — | conf |
MIXDES
|
| 2016 | — | conf |
MIPRO
|
| 2015 | C | conf |
DDECS
|
| 2015 | C | conf |
DDECS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
MIXDES
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2014 | C | conf |
DDECS
|
| 2014 | C | conf |
DDECS
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Comput. Informatics
|
| 2014 | A | conf |
ECAI
|
| 2013 | J | jnl |
Microelectron. J.
|
| 2013 | C | conf |
DDECS
|
| 2013 | C | conf |
DDECS
|
| 2013 | C | conf |
DDECS
|
| 2012 | C | conf |
DDECS
|
| 2012 | C | conf |
DDECS
|
| 2012 | C | ed. |
DDECS
|
| 2012 | C | conf |
DDECS
|
| 2011 | — | conf |
ISABEL
|
| 2011 | C | conf |
DDECS
|
| 2011 | C | conf |
DDECS
|
| 2011 | C | conf |
DDECS
|
| 2010 | C | conf |
DDECS
|
| 2010 | C | conf |
DDECS
|
| 2009 | C | conf |
DDECS
|
| 2009 | C | conf |
DDECS
|
| 2009 | — | conf |
ECCTD
|
| 2008 | — | conf |
PATMOS
|
| 2008 | C | conf |
DDECS
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | C | conf |
DDECS
|
| 2008 | C | conf |
DDECS
|
| 2008 | — | conf |
ICECS
|
| 2008 | C | conf |
DDECS
|
| 2007 | C | conf |
DDECS
|
| 2006 | — | conf |
LATW
|
| 2006 | C | conf |
DDECS
|
| 2006 | C | conf |
DDECS
|
| 2005 | J | jnl |
IEEE Trans. Reliab.
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
Neural Comput. Appl.
|
| 2002 | — | conf |
DFT
|
| 2000 | — | conf |
IOLTW
|
| 1999 | A | conf |
DATE
|
| 1997 | — | conf |
ED&TC
|