Victor M. van Santen

37 papers A* 2A 4C 2Misc 2Journal 16Unranked 10

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Cryo-CACTI: Cryogenic-Aware CACTI for Cache Modeling Down to 10K in Advanced 7nm FinFETs. IEEE Trans. Computers Divya Praneetha Ravipati, Victor M. van Santen, Shivendra Singh Parihar, Yogesh Singh Chauhan, Preeti Ranjan Panda, Hussam Amrouch
2025	J	`jnl`	Workload Compression Techniques to Scale Defect-Centric BTI Models to the Circuit Level. IEEE Trans. Circuits Syst. I Regul. Pap. Andrés Santana-Andreo, Victor M. van Santen, Rafael Castro-López, Elisenda Roca, Hussam Amrouch, Francisco V. Fernández
2024	J	`jnl`	CAPE: Criticality-Aware Performance and Energy Optimization Policy for NCFET-Based Caches. IEEE Trans. Computers Divya Praneetha Ravipati, Ramanuj Goel, Victor M. van Santen, Hussam Amrouch, Preeti Ranjan Panda
2024	J	`jnl`	Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Trans. Circuits Syst. I Regul. Pap. Tarek Mohamed, Victor M. van Santen, Lilas Alrahis, Ozgur Sinanoglu, Hussam Amrouch
2024	—	`conf`	Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). IRPS Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme
2024	—	`conf`	Technology Mapping for Cryogenic CMOS Circuits. ISVLSI Benjamin Hien, Marcel Walter, Victor M. van Santen, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch, Robert Wille
2023	—	`conf`	Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. DFT Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch
2023	—	`conf`	Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. IRPS Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez, Rafael Castro-López, Elisenda Roca, Hussam Amrouch
2023	J	`jnl`	Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Trans. Circuits Syst. I Regul. Pap. Shivendra Singh Parihar, Victor M. van Santen, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch
2023	—	`—`	Degradation Models and Optimizations for CMOS Circuits Victor M. van Santen
2023	A*	`conf`	Design Automation for Cryogenic CMOS Circuits. DAC Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch
2023	J	`jnl`	Massively Parallel Circuit Setup in GPU-SPICE. IEEE Trans. Computers Victor M. van Santen, Fu Lam Florian Diep, Jörg Henkel, Hussam Amrouch
2023	J	`jnl`	Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Trans. Very Large Scale Integr. Syst. Divya Praneetha Ravipati, Victor M. van Santen, Sami Salamin, Hussam Amrouch, Preeti Ranjan Panda
2022	J	`jnl`	FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies. IEEE Trans. Very Large Scale Integr. Syst. Divya Praneetha Ravipati, Rajesh Kedia, Victor M. van Santen, Jörg Henkel, Preeti Ranjan Panda, Hussam Amrouch
2022	J	`jnl`	On the Reliability of FeFET On-Chip Memory. IEEE Trans. Computers Paul R. Genssler, Victor M. van Santen, Jörg Henkel, Hussam Amrouch
2021	J	`jnl`	Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient. IEEE Access Sami Salamin, Victor M. van Santen, Martin Rapp, Jörg Henkel, Hussam Amrouch
2021	Misc	`conf`	Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. VTS Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch
2021	—	`conf`	Self-Heating Effects from Transistors to Gates. VLSI-DAT Victor M. van Santen, Linda Schillinger, Hussam Amrouch
2021	Misc	`conf`	Special Session: Machine Learning for Semiconductor Test and Reliability. VTS Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan
2020	—	`conf`	BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch
2020	—	`conf`	Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. ASP-DAC Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch
2020	A	`conf`	Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities. ICCAD Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch
2020	—	`conf`	NCFET to Rescue Technology Scaling: Opportunities and Challenges. ASP-DAC Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel
2020	J	`jnl`	On the Workload Dependence of Self-Heating in FinFET Circuits. IEEE Trans. Circuits Syst. II Express Briefs Victor M. van Santen, Hussam Amrouch, Pooja Kumari, Jörg Henkel
2019	J	`jnl`	Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. Circuits Syst. II Express Briefs Victor M. van Santen, Hussam Amrouch, Jörg Henkel
2019	J	`jnl`	Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level. IEEE Trans. Circuits Syst. I Regul. Pap. Victor M. van Santen, Hussam Amrouch, Jörg Henkel
2019	J	`jnl`	Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. Very Large Scale Integr. Syst. Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
2019	C	`conf`	Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel
2018	A	`conf`	Estimating and optimizing BTI aging effects: from physics to CAD. ICCAD Hussam Amrouch, Victor M. van Santen, Jörg Henkel
2018	C	`conf`	Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE. IOLTS Victor M. van Santen, Hussam Amrouch, Jörg Henkel
2018	J	`jnl`	Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. IEEE Trans. Circuits Syst. I Regul. Pap. Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel
2018	—	`conf`	Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability. IRPS Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría
2017	J	`jnl`	Interdependencies of Degradation Effects and Their Impact on Computing. IEEE Des. Test Hussam Amrouch, Victor M. van Santen, Jörg Henkel
2016	A	`conf`	Aging-aware voltage scaling. DATE Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
2016	A*	`conf`	Designing guardbands for instantaneous aging effects. DAC Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel
2015	—	`conf`	Connecting the physical and application level towards grasping aging effects. IRPS Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel
2014	A	`conf`	Towards interdependencies of aging mechanisms. ICCAD Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel