| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A | conf |
DATE
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2024 | — | conf |
MOCAST
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | — | conf |
MOCAST
|
| 2023 | — | conf |
Design and Evaluation of a Peripheral for Integrity Checking to Improve RAS in RISC-V Architectures.
SEEDA-CECNSM
|
| 2023 | — | conf |
SEEDA-CECNSM
|
| 2023 | B | conf |
ETS
|
| 2023 | — | conf |
MOCAST
|
| 2023 | B | conf |
ETS
|
| 2022 | C | conf |
IOLTS
|
| 2021 | — | conf |
MOCAST
|
| 2019 | C | conf |
IOLTS
|
| 2019 | C | conf |
IOLTS
|
| 2018 | C | conf |
IOLTS
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | B | conf |
ETS
|
| 2017 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | — | conf |
DFT
|
| 2017 | — | conf |
DFT
|
| 2017 | B | conf |
ETS
|
| 2017 | A | conf |
ISLPED
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | — | conf |
DFT
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | C | conf |
IOLTS
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | C | conf |
IOLTS
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | B | conf |
ETS
|
| 2015 | B | conf |
ETS
|
| 2014 | — | conf |
ATS
|
| 2013 | — | — |
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | A | conf |
ICCAD
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | A | conf |
DATE
|
| 2010 | — | conf |
ISVLSI
|
| 2010 | — | conf |
ISVLSI (Selected papers)
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | A | conf |
DATE
|