Valery A. Vardanian

37 papers A 1B 3C 4Misc 9Journal 5Unranked 15
YearRankTypeTitle / Venue / Authors
2025 B conf
European Test Symposium Teams: an Anniversary Snapshot.
ETS
Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2024 — conf
An Approach for Increasing Memory Repair Efficiency.
EWDTS
Karen Amirkhanyan, A. Babayan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2024 — conf
Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs.
EWDTS
Karen Amirkhanyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian
2019 — conf
On a Method for Segmentation of Memory Instances with Row Redundancies.
EWDTS
Karen Amirkhanyan, Valery A. Vardanian
2015 — conf
An efficient approach for memory repair by reducing the number of spares.
EWDTS
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
2014 — conf
Extending fault periodicity table for testing faults in memories under 20nm.
EWDTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2014 Misc conf
Fault modeling and test algorithm creation strategy for FinFET-based memories.
VTS
Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian
2013 Misc conf
An effective solution for building memory BIST infrastructure based on fault periodicity.
VTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters.
EWDTS
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
Application of defect injection flow for fault validation in memories.
EWDTS
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
Impact of process variations on read failures in SRAMs.
EWDTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2012 J jnl
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 — conf
A Robust Solution for Embedded Memory Test and Repair.
Asian Test Symposium
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 C conf
Generic BIST architecture for testing of content addressable memories.
IOLTS
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 J jnl
Symmetry Measure for Memory Test and Its Application in BIST Optimization.
J. Electron. Test.
Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2010 — conf
An efficient March test for detection of all two-operation dynamic faults from subclass Sav.
EWDTS
H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian
2008 Misc conf
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories.
VTS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2007 C conf
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories.
DDECS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2007 J jnl
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.
J. Electron. Test.
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2006 — conf
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults.
MTDT
T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian
2006 Misc conf
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories.
VTS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2006 B conf
Minimal March Tests for Dynamic Faults in Random Access Memories.
ETS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2006 C conf
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories.
DDECS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2005 C conf
Impact of Soft Error Challenge on SoC Design.
IOLTS
Yervant Zorian, Valery A. Vardanian, K. Aleksanyan, K. Amirkhanyan
2005 Misc conf
Minimal March Tests for Unlinked Static Faults in Random Access Memories.
VTS
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian
2004 Misc conf
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms.
VTS
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2004 — conf
Embedded Memory Reliability: The SER Challenge.
MTDT
N. Derhacobian, Valery A. Vardanian, Yervant Zorian
2004 J jnl
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.
IEEE Des. Test Comput.
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2002 — conf
A March-Based Fault Location Algorithm for Static Random Access Memories.
IOLTW
Valery A. Vardanian, Yervant Zorian
2002 — conf
A March-Based Fault Location Algorithm for Static Random Access Memories.
MTDT
Valery A. Vardanian, Yervant Zorian
2001 — conf
An Approach for Evaluation of Redunancy Analysis Algorithms.
MTDT
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2000 A conf
Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check.
DATE
Valery A. Vardanian, Liana B. Mirzoyan
1997 Misc conf
Exact probabilistic analysis of error detection for parity checkers.
VTS
Valery A. Vardanian
1996 Misc conf
On completely robust path delay fault testable realization of logic functions.
VTS
Valery A. Vardanian
1994 J jnl
On the Complexity of Dynamic Tests for Logic Functions.
Acta Cybern.
Valery A. Vardanian
1994 Misc conf
On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions.
VTS
Valery A. Vardanian
1985 B conf
On the length of single dynamic tests for monotone Boolean functions.
FCT
Valery A. Vardanian