Valeria Kilchytska

11 papers Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2017 — conf
Back-gate bias effect on UTBB-FDSOI non-linearity performance.
ESSDERC
B. Kazemi Esfeh, Valeria Kilchytska, Bertrand Parvais, Nicolas Planes, M. Haond, Denis Flandre, Jean-Pierre Raskin
2017 — conf
Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications.
ESSDERC
K. Ben Ali, P. M. Gammon, C. W. Chan, F. Li, V. Pathirana, T. Trajkovic, Farzan Gity, Denis Flandre, Valeria Kilchytska
2014 — conf
Variability of UTBB MOSFET analog figures of merit in wide frequency range.
ESSDERC
Sergej Makovejev, Babak Kazemi Esfeh, Jean-Pierre Raskin, Valeria Kilchytska, Denis Flandre, Vincent Barral, Nicolas Planes, Michel Haond
2013 — conf
Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets.
ESSDERC
Sergej Makovejev, Babak Kazemi Esfeh, Jean-Pierre Raskin, Denis Flandre, Valeria Kilchytska, François Andrieu
2013 J jnl
Ultra-Low Power High Temperature and Radiation Hard Complementary Metal-Oxide-Semiconductor (CMOS) Silicon-on-Insulator (SOI) Voltage Reference.
Sensors
El Hafed Boufouss, Laurent A. Francis, Valeria Kilchytska, Pierre Gérard, Pascal Simon, Denis Flandre
2012 J jnl
High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs.
Microelectron. Reliab.
Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, Otilia Militaru, Guy Berger, Denis Flandre
2012 — conf
On the UTBB SOI MOSFET performance improvement in quasi-double-gate regime.
ESSDERC
Valeria Kilchytska, Denis Flandre, François Andrieu
2011 J jnl
Characterization and modelling of single event transients in LDMOS-SOI FETs.
Microelectron. Reliab.
Joaquín Alvarado, Valeria Kilchytska, El Hafed Boufouss, Denis Flandre
2011 J jnl
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer.
Microelectron. Reliab.
C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin
2010 J jnl
Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs.
Microelectron. Reliab.
Joaquín Alvarado, El Hafed Boufouss, Valeria Kilchytska, Denis Flandre
2007 J jnl
Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs.
Microelectron. J.
Joaquín Alvarado, Antonio Cerdeira, Valeria Kilchytska, Denis Flandre