Uwe Sparmann

21 papers A* 1A 2Misc 4Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
1999 J jnl
Universal delay test sets for logic networks.
IEEE Trans. Very Large Scale Integr. Syst.
Uwe Sparmann, Holger Müller, Sudhakar M. Reddy
1998 Misc conf
Improving Path Delay Fault Testability by Path Removal.
VTS
Uwe Sparmann, Lars Köller
1996 A conf
Local Transformations and Robust Dependent Path Delay.
ITC
Harry Hengster, Uwe Sparmann, Bernd Becker, Sudhakar M. Reddy
1996 — conf
Minimal Delay Test Sets for Unate Gate Networks.
Asian Test Symposium
Uwe Sparmann, Holger Müller, Sudhakar M. Reddy
1996 Misc conf
On minimizing the number of test points needed to achieve complete robust path delay fault testability.
VTS
Prasanti Uppaluri, Uwe Sparmann, Irith Pomeranz
1996 J jnl
On the effectiveness of residue code checking for parallel two's complement multipliers.
IEEE Trans. Very Large Scale Integr. Syst.
Uwe Sparmann, Sudhakar M. Reddy
1995 A* conf
Fast Identification of Robust Dependent Path Delay Faults.
DAC
Uwe Sparmann, D. Luxenburger, Kwang-Ting Cheng, Sudhakar M. Reddy
1995 J jnl
On the testability of iterative logic arrays.
Integr.
Bernd Becker, Ralf Hahn, Joachim Hartmann, Uwe Sparmann
1994 A conf
A Hierarchical Environment for Interactive Test Engineering.
ITC
Thomas Burch, Joachim Hartmann, Günter Hotz, M. Krallmann, U. Nikolaus, Sudhakar M. Reddy, Uwe Sparmann
1994 — conf
On the Effectiveness of Residue Code Checking for Parallel Two's Complement Multipliers.
FTCS
Uwe Sparmann, Sudhakar M. Reddy
1994 Misc conf
Two-Layer Wiring with Pin Preassignments is Easier if the Power Supply Nets are Already Generated.
VLSI Design
Paul Molitor, Uwe Sparmann, Dorothea Wagner
1993 Misc conf
On the check base selection problem for fast adders.
VTS
Uwe Sparmann
1992 — ch.
Derivation of High Quality Tests for Large Heterogeneous Circuits: Floating-Point Operations.
Informatik
Uwe Sparmann
1991 J jnl
A uniform test approach for RCC-adders.
Fundam. Informaticae
Bernd Becker, Uwe Sparmann
1991 J jnl
Computations over Finite Monoids and their Test Complexity.
Theor. Comput. Sci.
Bernd Becker, Uwe Sparmann
1991 — conf
Structure based methods for parallel pattern fault simulation in combinational circuits.
EURO-DAC
Bernd Becker, Ralf Hahn, Rolf Krieger, Uwe Sparmann
1991 — —
Strukturbasierte Testmethoden für arithmetische Schaltkreise.
Uwe Sparmann
1990 — conf
A graphical system for hierarchical specifications and checkups of VLSI circuits.
EURO-DAC
Bernd Becker, Thomas Burch, Günter Hotz, D. Kiel, Reiner Kolla, Paul Molitor, Hans-Georg Osthof, Gisela Pitsch, Uwe Sparmann
1989 — conf
Computations over finite monoids and their test complexity.
FTCS
Bernd Becker, Uwe Sparmann
1988 J jnl
Design and Test of a Pattern Matching Circuit.
J. Inf. Process. Cybern.
Uwe Sparmann
1988 — conf
Regular Structures and Testing: RCC-Adders.
AWOC
Bernd Becker, Uwe Sparmann