Uwe Gläser

21 papers A 4C 1Misc 1Journal 3Unranked 11
YearRankTypeTitle / Venue / Authors
1999 — conf
Modell Evaluation Using Genetic Manipulation Techniques.
Great Lakes Symposium on VLSI
H.-Ch. Dahmen, Uwe Gläser, Zoran Stamenkovic
1999 J jnl
SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante
1998 — conf
The Impact of Area Optimization for the Power Consumption of Controllers.
EUROMICRO
H.-Ch. Dahmen, Uwe Gläser
1997 — conf
A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits.
PARCO
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus
1997 — conf
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation.
Great Lakes Symposium on VLSI
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus
1996 A conf
An ATPG-Based Framework for Verifying Sequential Equivalence.
ITC
Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, Uwe Gläser
1996 — conf
Automatic Test Pattern Generation with Optimal Load Balancing.
PVM
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus
1996 J jnl
Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Uwe Gläser, Heinrich Theodor Vierhaus
1995 — conf
FOGBUSTER: an efficient algorithm for sequential test generation.
EURO-DAC
Uwe Gläser, Heinrich Theodor Vierhaus
1995 — conf
Gate delay fault test generation for non-scan circuits.
ED&TC
G. Van Brakel, Uwe Gläser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus
1995 Misc conf
Improving topological ATPG with symbolic techniques.
VTS
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus
1995 — conf
Logic optimization by an improved sequential redundancy addition and removal techniques.
ASP-DAC
Uwe Gläser, Kwang-Ting Cheng
1995 — conf
Systems Level Specification and Modeling of Reactive Systems: Concepts, Methods, and Tools.
EUROCAST
Uwe Gläser
1994 — —
Mehrebenen-Testgenerierung für synchrone Schaltwerke.
Uwe Gläser
1994 A conf
Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation.
ICCAD
Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold
1994 C conf
Testability Analysis for Test Generation in Synchronous Sequential Circuits.
ICCD
R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus
1993 A conf
CMOS Bridges and Resistive Transistor Faults: I
ITC
Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser
1993 J jnl
Fault behavior and testability of asynchronous CMOS circuits.
Microprocess. Microprogramming
Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano
1992 — conf
MILEF: an efficient approach to mixed level automatic test pattern generation.
EURO-DAC
Uwe Gläser, Heinrich Theodor Vierhaus
1992 A conf
Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects.
ITC
Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus
1989 — conf
Fehlererkennung und Fehlertoleranz beim assoziativen RAM(ARAM)-Speicher.
Fehlertolerierende Rechensysteme
Uwe Gläser, U. Steinhausen