Usha Sandeep Mehta

14 papers C 1Misc 1Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
2018 J jnl
Multiple Missing Cell Defect Modeling for QCA Devices.
J. Electron. Test.
Vaishali H. Dhare, Usha Sandeep Mehta
2016 J jnl
Guest Editorial.
IET Comput. Digit. Tech.
Mark Zwolinski, Manoj Singh Gaur, Vijay Laxmi, Usha Sandeep Mehta
2015 — conf
A Hamming code based technique to resolve the bit flip impact on compressed VLSI test data in IP core based SoC.
VDAT
Harikrishna Parmar, Usha Sandeep Mehta
2015 — conf
Development of Radiation Hardened by Design(RHBD) primitive gates using 0.18μm CMOS technology.
VDAT
Rakesh Trivedi, N. M. Devashrayee, Usha Sandeep Mehta, N. M. Desai, Himanshu Patel
2011 — conf
Analysis of test data compression techniques emphasizing statistical coding schemes.
ICWET
Kinjal A. Bhavsar, Usha Sandeep Mehta
2011 J jnl
Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey.
VLSI Design
Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee
2011 J jnl
Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method.
VLSI Design
Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee
2010 — conf
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead.
ISVLSI
Usha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta
2010 — conf
Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead.
APCCAS
Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee
2010 — conf
Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method.
SoC
Usha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta
2010 Misc conf
Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes.
VLSI Design
Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee
2010 J jnl
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.
J. Electron. Test.
Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee
2010 J jnl
Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey.
VLSI Design
Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee
2009 C conf
Survey of Test Data Compression Technique Emphasizing Code Based Schemes.
DSD
Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee