| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | C | conf |
MODELSWARD
|
| 2015 | J | jnl |
IEEE Trans. Computers
|
| 2014 | — | conf |
SAFECOMP Workshops
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | C | conf |
IOLTS
|
| 2012 | J | jnl |
IEEE Trans. Computers
|
| 2012 | B | conf |
Requirement Decomposition and Testability in Development of Safety-Critical Automotive Components, .
SAFECOMP
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | Misc | conf |
VLSI Design
|
| 2012 | B | conf |
ETS
|
| 2011 | A | conf |
DATE
|
| 2011 | A | conf |
ITC
|
| 2011 | — | conf |
Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization.
DSN Workshops
|
| 2011 | C | conf |
DDECS
|
| 2011 | — | conf |
DELTA
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | — | conf |
DELTA
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
ATS
|
| 2007 | — | conf |
ATS
|
| 2005 | B | conf |
ETS
|