Tuami Lasri

17 papers C 1Journal 9Unranked 7
YearRankTypeTitle / Venue / Authors
2016 J jnl
Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform.
IEEE Trans. Instrum. Meas.
Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri
2015 — conf
Forward V-band vector network analyzer based on a modified six-port technique.
WiSNet
Kamel Haddadi, Tuami Lasri
2015 — conf
Measurement accuracy and repeatability in near-field scanning microwave microscopy.
I2MTC
Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Gilles Dambrine, Tuami Lasri
2015 — conf
On-wafer probe station for microwave metrology at the nanoscale.
I2MTC
Abdelhatif El Fellahi, Kamel Haddadi, Jaouad Marzouk, Steve Arscott, Christophe Boyaval, Tuami Lasri, Gilles Dambrine
2014 — conf
1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer.
NEWCAS
Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria
2014 J jnl
Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement.
IEEE Trans. Instrum. Meas.
Kamel Haddadi, Tuami Lasri
2014 J jnl
Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications.
IEEE Trans. Instrum. Meas.
Hind Bakli, Kamel Haddadi, Tuami Lasri
2014 — conf
Six-port technology for millimeter-wave radar and imaging applications.
WiSNet
Kamel Haddadi, Tuami Lasri
2013 — conf
Interferometric technique for scanning near-field microwave microscopy applications.
I2MTC
Hind Bakli, Kamel Haddadi, Tuami Lasri
2013 J jnl
Scanning Microwave Near-Field Microscope Based on the Multiport Technology.
IEEE Trans. Instrum. Meas.
Kamel Haddadi, Tuami Lasri
2012 J jnl
Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications.
Microelectron. Reliab.
Etienne Herth, H. Desré, Emmanuelle Algré, Christiane Legrand, Tuami Lasri
2011 J jnl
Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer.
IEEE Trans. Instrum. Meas.
Kamel Haddadi, M. M. Wang, David Glay, Tuami Lasri
2010 J jnl
Optimization of SiN
Microelectron. Reliab.
Etienne Herth, Bernard Legrand, Lionel Buchaillot, Nathalie Rolland, Tuami Lasri
2008 J jnl
Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks.
IEEE Trans. Instrum. Meas.
M. Maazi, O. Benzaim, David Glay, Tuami Lasri
2008 J jnl
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique.
IEEE Trans. Instrum. Meas.
O. Benzaim, Kamel Haddadi, M. M. Wang, M. Maazi, David Glay, Tuami Lasri
2006 C conf
Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements.
ISCAS
Kamel Haddadi, David Glay, Tuami Lasri
2006 — conf
Wide-band 0.9 GHz to 4 GHz Four-Port Receiver.
ICECS
Kamel Haddadi, Hassan El Aabbaoui, Christophe Loyez, David Glay, Nathalie Rolland, Tuami Lasri