| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2010 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2008 | B | conf |
Document Analysis Systems
|
| 2007 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|
| 2007 | B | conf |
SMC
|
| 2006 | — | conf |
ATS
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | B | conf |
SMC
|
| 2005 | B | conf |
SMC
|
| 2005 | J | jnl |
J. Comput. Sci. Technol.
|
| 2004 | — | conf |
ASP-DAC
|
| 2003 | B | conf |
SMC
|
| 2003 | — | conf |
CIRA
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
CIRA
|
| 2003 | — | conf |
CIRA
|
| 2002 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|
| 2002 | — | conf |
IWFHR
|
| 2002 | Misc | conf |
MVA
|
| 2002 | B | conf |
IEEE Congress on Evolutionary Computation
|
| 2001 | B | conf |
FUZZ-IEEE
|
| 2001 | A | conf |
ICDAR
|
| 2001 | J | jnl |
Syst. Comput. Jpn.
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | B | conf |
CEC
|
| 2001 | A | conf |
ICDAR
|
| 2001 | B | conf |
CEC
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
IJCNN (3)
|
| 1999 | — | conf |
ASP-DAC
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | J | jnl |
Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits.
Syst. Comput. Jpn.
|
| 1998 | Misc | conf |
VTS
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1992 | — | conf |
FGCS
|
| 1988 | — | conf |
FGCS
|
| 1985 | — | conf |
LP
|