Tristan Dubois

12 papers Journal 7Unranked 5
YearRankTypeTitle / Venue / Authors
2024 — conf
Enhancing High-Speed Ethernet Link Design at 25 Gbps in Aerospace Environments Through Optimization Algorithms.
EMC Compo
Soazig Le Bihan, Tristan Dubois, Jean-Baptiste Bégueret, Adil El Abbazi
2024 — conf
Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform.
EMC Compo
Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador
2020 — conf
Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection.
ICIT
L. Curos, Tristan Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa
2018 J jnl
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.
Microelectron. Reliab.
M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp
2017 J jnl
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.
Microelectron. Reliab.
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont
2015 J jnl
A New Method for the Characterization of Electronic Components Immunity.
IEEE Trans. Instrum. Meas.
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
2015 J jnl
Characterization and model of temperature effect on the conducted immunity of Op-Amp.
Microelectron. Reliab.
Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp
2015 J jnl
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements.
Microelectron. Reliab.
Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp
2013 — conf
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.
EMC Compo
Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp
2011 — conf
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors.
LATW
Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jérémy Raoult, Philippe Calvel
2010 J jnl
Probe Characterization for Electromagnetic Near-Field Studies.
IEEE Trans. Instrum. Meas.
Sylvie Jarrix, Tristan Dubois, R. Adam, Philippe Nouvel, Bruno Azaïs, Daniel Gasquet
2008 J jnl
Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits.
IEEE Trans. Instrum. Meas.
Tristan Dubois, Sylvie Jarrix, Annick Penarier, Philippe Nouvel, Daniel Gasquet, Laurent Chusseau, Bruno Azaïs