Toshiyuki Okayasu

12 papers A 9Unranked 3

Year	Rank	Type	Title / Venue / Authors
2013	A	`conf`	30-Gb/s optical and electrical test solution for high-volume testing. ITC Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu
2012	A	`conf`	Real-time testing method for 16 Gbps 4-PAM signal interface. ITC Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2011	A	`conf`	Real-time testing method for 16 Gbps 4-PAM signal interface. ITC Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2009	—	`conf`	CMOS optical 4-PAM VCSEL driver with modal-dispersion equalizer for 10Gb/s 500m MMF transmission. ISSCC Daisuke Watanabe, Atsushi Ono, Toshiyuki Okayasu
2009	A	`conf`	Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. ITC Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu
2007	—	`conf`	2GS/s, 10ps Resolution CMOS Differential Time-to-Digital Converter for Real-Time Testing of Source-Synchronous Memory Device. CICC Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu
2006	—	`conf`	1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications. ISSCC Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe
2006	A	`conf`	Multi Strobe Circuit for 2.133GHz Memory Test System. ITC Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka
2005	A	`conf`	CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. ITC Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe
2004	A	`conf`	34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. ITC Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu
2002	A	`conf`	CMOS Circuit Technology for Precise GHz Timing Generator. ITC Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto
1994	A	`conf`	Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC. ITC Takashi Sekino, Toshiyuki Okayasu