Toshiki Nakamura

19 papers A 3C 2Journal 7Unranked 7
YearRankTypeTitle / Venue / Authors
2021 J jnl
MIMII DUE: Sound Dataset for Malfunctioning Industrial Machine Investigation and Inspection with Domain Shifts due to Changes in Operational and Environmental Conditions.
CoRR
Ryo Tanabe, Harsh Purohit, Kota Dohi, Takashi Endo, Yuki Nikaido, Toshiki Nakamura, Yohei Kawaguchi
2021 — conf
MIMII Due: Sound Dataset for Malfunctioning Industrial Machine Investigation and Inspection with Domain Shifts Due to Changes in Operational and Environmental Conditions.
WASPAA
Ryo Tanabe, Harsh Purohit, Kota Dohi, Takashi Endo, Yuki Nikaido, Toshiki Nakamura, Yohei Kawaguchi
2021 J jnl
n-hot: Efficient bit-level sparsity for powers-of-two neural network quantization.
CoRR
Yuiko Sakuma, Hiroshi Sumihiro, Jun Nishikawa, Toshiki Nakamura, Ryoji Ikegaya
2020 — conf
Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring.
DCASE
Yuma Koizumi, Yohei Kawaguchi, Keisuke Imoto, Toshiki Nakamura, Yuki Nikaido, Ryo Tanabe, Harsh Purohit, Kaori Suefusa, Takashi Endo, Masahiro Yasuda, Noboru Harada
2020 J jnl
Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring.
CoRR
Yuma Koizumi, Yohei Kawaguchi, Keisuke Imoto, Toshiki Nakamura, Yuki Nikaido, Ryo Tanabe, Harsh Purohit, Kaori Suefusa, Takashi Endo, Masahiro Yasuda, Noboru Harada
2019 J jnl
3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition.
IEEE J. Solid State Circuits
Yoshiaki Deguchi, Toshiki Nakamura, Atsuna Hayakawa, Ken Takeuchi
2019 J jnl
Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories.
IEEE J. Solid State Circuits
Toshiki Nakamura, Yoshiaki Deguchi, Ken Takeuchi
2019 — conf
Privacy-Aware Data-Lifetime Control NAND Flash System for Right to be Forgotten with In-3D Vertical Cell Processing.
A-SSCC
Shun Suzuki, Kyoji Mizoguchi, Hikaru Watanabe, Toshiki Nakamura, Yoshiaki Deguchi, Keita Mizushina, Ken Takeuchi
2019 A conf
Scene Text Magnifier.
ICDAR
Toshiki Nakamura, Anna Zhu, Seiichi Uchida
2019 J jnl
Scene Text Magnifier.
CoRR
Toshiki Nakamura, Anna Zhu, Seiichi Uchida
2018 — conf
9.1x Error acceptable adaptive artificial neural network coupled LDPC ECC for charge-trap and floating-gate 3D-NAND flash memories.
CICC
Toshiki Nakamura, Yoshiaki Deguchi, Ken Takeuchi
2018 C conf
Data-Aware Partial ECC with Data Modulation of ReRAM with Non-volatile In-memory Computing for Image Recognition with Deep Neural Network.
ISCAS
Atsuna Hayakawa, Toshiki Nakamura, Yoshiaki Deguchi, Kazuki Maeda, Ken Takeuchi
2018 — conf
Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x.
ESSDERC
Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Ken Takeuchi
2018 — conf
Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs.
IRPS
Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Kyoji Mizoguchi, Ken Takeuchi
2018 C conf
Layer-by-layer Adaptively Optimized ECC of NAND flash-based SSD Storing Convolutional Neural Network Weight for Scene Recognition.
ISCAS
Keita Mizushina, Toshiki Nakamura, Yoshiaki Deguchi, Ken Takeuchi
2017 — conf
12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition.
CICC
Yoshiaki Deguchi, Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi
2017 A conf
Scene Text Eraser.
ICDAR
Toshiki Nakamura, Anna Zhu, Keiji Yanai, Seiichi Uchida
2017 J jnl
Scene Text Eraser.
CoRR
Toshiki Nakamura, Anna Zhu, Keiji Yanai, Seiichi Uchida
2015 A conf
An on-chip, electricity-free and single-layer pressure sensor for microfluidic applications.
IROS
Chia-Hung Dylan Tsai, Toshiki Nakamura, Makoto Kaneko