| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A | conf |
DATE
|
| 2025 | A | conf |
ITC
|
| 2025 | J | jnl |
IEICE Trans. Electron.
|
| 2025 | — | conf |
ATS
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2023 | — | conf |
ISSCC
|
| 2023 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2022 | J | jnl |
IEICE Trans. Electron.
|
| 2022 | — | conf |
ISQED
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2018 | — | conf |
VLSI-SoC (Selected Papers)
|
| 2018 | C | conf |
VLSI-SoC
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2018 | J | jnl |
IEICE Trans. Electron.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Trans. Electron.
|
| 2017 | — | conf |
A 15 × 15 SPAD array sensor with breakdown-pixel-extraction architecture for efficient data readout.
ASP-DAC
|
| 2017 | — | conf |
ICECS
|
| 2017 | J | jnl |
IEICE Trans. Electron.
|
| 2017 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2017 | — | conf |
IEEE SENSORS
|
| 2017 | — | conf |
ICECS
|
| 2017 | — | conf |
ICECS
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2017 | B | conf |
ETS
|
| 2017 | — | conf |
Computational Imaging
|
| 2017 | — | conf |
NEWCAS
|
| 2016 | — | conf |
ESSCIRC
|
| 2016 | — | conf |
A-SSCC
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | J | jnl |
IEICE Trans. Electron.
|
| 2016 | — | conf |
ISQED
|
| 2016 | A | conf |
DATE
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | — | conf |
ISQED
|
| 2016 | — | conf |
EWME
|
| 2016 | J | jnl |
IEICE Trans. Electron.
|
| 2016 | A | conf |
ITC
|
| 2016 | — | conf |
ICECS
|
| 2015 | — | conf |
ATS
|
| 2015 | — | conf |
A calibration-free time difference accumulator using two pulses propagating on a single buffer ring.
A-SSCC
|
| 2015 | C | conf |
DDECS
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Trans. Electron.
|
| 2015 | — | conf |
NORCAS
|
| 2014 | C | conf |
DDECS
|
| 2014 | C | conf |
Numerical and theoretical analysis on voltage and time domain dynamic range of scaled CMOS circuits.
DDECS
|
| 2014 | A | conf |
ITC
|
| 2014 | — | conf |
EWME
|
| 2013 | — | conf |
ICECS
|
| 2013 | — | conf |
CICC
|
| 2013 | — | conf |
ICECS
|
| 2013 | J | jnl |
IEICE Trans. Electron.
|
| 2012 | — | conf |
CICC
|
| 2012 | J | jnl |
IEICE Trans. Electron.
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
IEICE Trans. Electron.
|
| 2012 | J | jnl |
IEICE Trans. Electron.
|
| 2012 | A | conf |
ITC
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | C | conf |
DDECS
|
| 2011 | J | jnl |
IEICE Trans. Electron.
|
| 2011 | — | conf |
ESSCIRC
|
| 2011 | — | conf |
ISOCC
|
| 2010 | J | jnl |
IEICE Electron. Express
|
| 2010 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2010 | — | conf |
ESSCIRC
|
| 2010 | C | conf |
DDECS
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | J | jnl |
IEICE Trans. Electron.
|
| 2010 | — | conf |
ESSCIRC
|
| 2009 | — | conf |
ESSCIRC
|
| 2009 | C | conf |
DDECS
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | C | conf |
DDECS
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2009 | — | conf |
ECCTD
|
| 2007 | — | conf |
ASP-DAC
|
| 2007 | — | conf |
ISSCC
|
| 2007 | — | conf |
ISSCC
|
| 2006 | J | jnl |
IEICE Trans. Electron.
|
| 2006 | J | jnl |
IEICE Trans. Electron.
|
| 2005 | — | conf |
ESSCIRC
|
| 2005 | J | jnl |
IEICE Trans. Electron.
|
| 2005 | J | jnl |
IEICE Trans. Electron.
|
| 2005 | J | jnl |
IEICE Trans. Electron.
|
| 2003 | — | conf |
CICC
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|