Tony Ambler

15 papers A 2B 1C 1Misc 1Journal 6Unranked 3
YearRankTypeTitle / Venue / Authors
2006 — conf
An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.
DFT
Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack
2005 B conf
A knowledge-based dispatching model for field service.
SMC
Yu-Ting Lin, Tony Ambler
2005 Misc conf
An Economic Selecting Model for DFT Strategies.
VTS
Yu-Ting Lin, Tony Ambler
2005 A conf
Cost-effective designs of field service for electronic systems.
ITC
Yu-Ting Lin, David Williams, Tony Ambler
2005 C conf
Maintenance policy designs for PC manufacturers.
CCA
Yu-Ting Lin, Tony Ambler
2005 A conf
Two efficient methods to reduce power and testing time.
ISLPED
Il-soo Lee, Tony Ambler
2004 — conf
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.
Asian Test Symposium
Il-soo Lee, Yong Min Hur, Tony Ambler
2001 J jnl
Economics of Built-in Self-Test.
IEEE Des. Test Comput.
Louis Y. Ungar, Tony Ambler
2001 — conf
Robust transition density estimation by considering input/output transition behavior.
ISCAS (5)
Dongho Kim, Tony Ambler
2001 J jnl
Test Strategies and Marriage Partners.
IEEE Des. Test Comput.
Tony Ambler
2001 J jnl
Test Trade-Offs Take Center Stage at ITC.
IEEE Des. Test Comput.
Tony Ambler, Donald L. Wheater
1999 J jnl
Guest Editors' Introduction: Test and the Product Life Cycle.
IEEE Des. Test Comput.
Tony Ambler, Ben Bennetts
1997 J jnl
Design and Test Economics-An Extra Dimension.
IEEE Des. Test Comput.
Tony Ambler, Magdy S. Abadir
1994 J jnl
Introduction.
J. Electron. Test.
Magdy S. Abadir, Tony Ambler
1991 — ed.
Proceedings of the conference on European design automation, EURO-DAC'91, Amsterdam, The Netherlands, 1991
EURO-DAC
Tony Ambler, Jochen A. G. Jess, Hugo De Man