Tongzhi Niu

21 papers C 1Journal 19Unranked 1
YearRankTypeTitle / Venue / Authors
2026 J jnl
An Integrated Sensing-Computing Processor for Spectral-Based Chinese Herbal Medicine Classification With Algorithm-FPGA Co-Design.
IEEE Trans. Ind. Electron.
Hui Zhang, Hai Wang, Bingrui Zhao, Tongzhi Niu, Yunkang Cao, Yaonan Wang
2026 J jnl
Background-Adaptive Neural Networks for Surface Mount Device Defect Segmentation by Comparing With Positive Samples.
IEEE Trans. Consumer Electron.
Tongzhi Niu, Biao Chen, Yexin Fan, Kai Li, Fuqiang Zhong, Bin Li, Hui Zhang
2026 J jnl
FPF: A Focused Perception Framework for Small Defect Identification in Complex Power Scenarios.
IEEE Trans. Ind. Informatics
Hui Zhang, Hang Liu, Baheti Biekezat, Rui Du, Yunkang Cao, Kaining Zhang, Tongzhi Niu, Yaonan Wang
2025 J jnl
Bayes-DIC Net: Estimating Digital Image Correlation Uncertainty with Bayesian Neural Networks.
CoRR
Biao Chen, Zhenhua Lei, Yahui Zhang, Tongzhi Niu
2024 J jnl
A drift detection method for industrial images based on a defect segmentation model.
Knowl. Based Syst.
Weifeng Li, Bin Li, Zhenrong Wang, Chaochao Qiu, Shuanlong Niu, Xin Tan, Tongzhi Niu
2024 J jnl
A multisensory Interaction Framework for Human-Cyber-Physical System based on Graph Convolutional Networks.
Adv. Eng. Informatics
Wenqian Qi, Chun-Hsien Chen, Tongzhi Niu, Shuhui Lyu, Shouqian Sun
2024 J jnl
A novel deep learning motivated data augmentation system based on defect segmentation requirements.
J. Intell. Manuf.
Shuanlong Niu, Yaru Peng, Bin Li, Yuanhong Qiu, Tongzhi Niu, Weifeng Li
2024 J jnl
A-Net: An A-Shape Lightweight Neural Network for Real-Time Surface Defect Segmentation.
IEEE Trans. Instrum. Meas.
Biao Chen, Tongzhi Niu, Wenyong Yu, Ruoqi Zhang, Zhenrong Wang, Bin Li
2024 J jnl
Feature matching driven background generalization neural networks for surface defect segmentation.
Knowl. Based Syst.
Biao Chen, Tongzhi Niu, Ruoqi Zhang, Hang Zhang, Yuchen Lin, Bin Li
2024 J jnl
Learning trustworthy model from noisy labels based on rough set for surface defect detection.
Appl. Soft Comput.
Tongzhi Niu, Zhenrong Wang, Weifeng Li, Kai Li, Yuwei Li, Guiyin Xu, Bin Li
2024 J jnl
NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search.
Adv. Eng. Informatics
Zhenrong Wang, Bin Li, Weifeng Li, Shuanlong Niu, Miao Wang, Tongzhi Niu
2024 J jnl
Research and prospects of virtual reality systems applying exoskeleton technology.
Univers. Access Inf. Soc.
Wenqian Qi, Shouqian Sun, Tongzhi Niu, Dongwei Zhao
2023 J jnl
A generalized well neural network for surface defect segmentation in Optical Communication Devices via Template-Testing comparison.
Comput. Ind.
Tongzhi Niu, Zhiyu Xie, Jie Zhang, Lixin Tang, Bin Li, Hao Wang
2023 C conf
Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples.
IECON
Tongzhi Niu, Biao Chen, Zhenrong Wang, Ruoqi Zhang, Bin Li
2023 J jnl
Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection.
CoRR
Tongzhi Niu, Bin Li, Kai Li, Yufeng Lin, Yuwei Li, Weifeng Li, Zhenrong Wang
2023 J jnl
NAS-ASDet: An Adaptive Design Method for Surface Defect Detection Network using Neural Architecture Search.
CoRR
Zhenrong Wang, Bin Li, Weifeng Li, Shuanlong Niu, Wang Miao, Tongzhi Niu
2023 J jnl
Selecting informative data for defect segmentation from imbalanced datasets via active learning.
Adv. Eng. Informatics
Weifeng Li, Bin Li, Shuanlong Niu, Zhenrong Wang, Baohui Liu, Tongzhi Niu
2022 J jnl
Clear Memory-Augmented Auto-Encoder for Surface Defect Detection.
CoRR
Wei Luo, Tongzhi Niu, Lixin Tang, Wenyong Yu, Bin Li
2022 J jnl
Joint-Prior-Based Uneven Illumination Image Enhancement for Surface Defect Detection.
Symmetry
Yuanhong Qiu, Shuanlong Niu, Tongzhi Niu, Weifeng Li, Bin Li
2020 J jnl
Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition.
IEEE Access
Yuanhong Qiu, Lixin Tang, Bin Li, Suanlong Niu, Tongzhi Niu
2019 — conf
DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network.
CASE
Shuanlong Niu, Hui Lin, Tongzhi Niu, Bin Li, Xinggang Wang