| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2025 | — | conf |
ATS
|
| 2025 | — | conf |
ITC-Asia
|
| 2024 | — | conf |
ITC-Asia
|
| 2023 | — | conf |
ITC-Asia
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | — | conf |
ATS
|
| 2021 | C | conf |
IOLTS
|
| 2021 | — | conf |
ICCE-TW
|
| 2020 | — | conf |
ITC-Asia
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | — | conf |
VLSI-DAT
|
| 2020 | Misc | conf |
VTS
|
| 2020 | — | conf |
ITC-Asia
|
| 2019 | — | conf |
A Delay-Aware Implementation Scheme for Cost-Effective Implication-Based Concurrent Error Detection.
ITC-Asia
|
| 2019 | — | conf |
AICAS
|
| 2018 | — | conf |
ITC-Asia
|
| 2018 | — | conf |
ITC-Asia
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2017 | — | conf |
ITC-Asia
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | — | conf |
ATS
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
IEICE Trans. Electron.
|
| 2015 | C | conf |
IOLTS
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | B | conf |
ETS
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | — | conf |
APCCAS
|
| 2012 | C | conf |
ISCAS
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | A | conf |
DATE
|
| 2007 | — | conf |
ATS
|
| 2006 | Misc | conf |
VTS
|
| 2005 | A | conf |
ITC
|