Todd L. Graves

23 papers A* 2B 1Journal 19Unranked 1
YearRankTypeTitle / Venue / Authors
2016 J jnl
A Note on Incorporating Simultaneous Multi-level Failure Time Data in System Reliability Assessments.
Qual. Reliab. Eng. Int.
Todd L. Graves, Michael S. Hamada
2011 J jnl
A Random Onset Model for Degradation of High-Reliability Systems.
Technometrics
Scott A. Vander Wiel, Alyson G. Wilson, Todd L. Graves, C. Shane Reese
2011 J jnl
Alternatives to the Least Squares Solution to Peelle's Pertinent Puzzle.
Algorithms
Tom Burr, Todd L. Graves, Nicolas W. Hengartner, Toshihiko Kawano, Feng Pan, Patrick Talou
2010 J jnl
Reliability Models for Almost-Series and Almost-Parallel Systems.
Technometrics
Todd L. Graves, Christine M. Anderson-Cook, Michael S. Hamada
2009 J jnl
Augmenting real data with synthetic data: an application in assessing Radio-Isotope identification algorithms.
Qual. Reliab. Eng. Int.
Tom Burr, Michael S. Hamada, Todd L. Graves, S. Myers
2009 J jnl
Resource allocation for reliability of a complex system with aging components.
Qual. Reliab. Eng. Int.
Christine M. Anderson-Cook, Todd L. Graves, Michael S. Hamada
2008 J jnl
Using simultaneous higher-level and partial lower-level data in reliability assessments.
Reliab. Eng. Syst. Saf.
Todd L. Graves, Michael S. Hamada, Richard M. Klamann, Andrew C. Koehler, Harry F. Martz
2007 J jnl
A fully Bayesian approach for combining multi-level information in multi-state fault tree quantification.
Reliab. Eng. Syst. Saf.
Todd L. Graves, Michael S. Hamada, Richard M. Klamann, Andrew C. Koehler, Harry F. Martz
2007 J jnl
Estimating a Proportion Using Stratified Data From Both Convenience and Random Samples.
Technometrics
Todd L. Graves, Michael S. Hamada, Jane M. Booker, Michele Decroix, Kathy Chilcoat, Clint Bowyer
2006 J jnl
Accounting for seasonal patterns in syndromic surveillance data for outbreak detection.
BMC Medical Informatics Decis. Mak.
Tom Burr, Todd L. Graves, Richard M. Klamann, Sarah Michalak, Richard Picard, Nicolas W. Hengartner
2006 J jnl
Biased Reduced Sampling: Detectability of an Attribute and Estimation of Prevalence.
Qual. Reliab. Eng. Int.
Todd L. Graves, Michael S. Hamada
2004 J jnl
A fully Bayesian approach for combining multilevel failure information in fault tree quantification and optimal follow-on resource allocation.
Reliab. Eng. Syst. Saf.
Michael S. Hamada, Harry F. Martz, C. Shane Reese, Todd L. Graves, Val Johnson, Alyson G. Wilson
2002 J jnl
Using Version Control Data to Evaluate the Impact of Software Tools: A Case Study of the Version Editor.
IEEE Trans. Software Eng.
David L. Atkins, Thomas Ball, Todd L. Graves, Audris Mockus
2002 J jnl
Visualizing Software Changes.
IEEE Trans. Software Eng.
Stephen G. Eick, Todd L. Graves, Alan F. Karr, Audris Mockus, Paul Schuster
2001 J jnl
An empirical study of regression test selection techiques.
ACM Trans. Softw. Eng. Methodol.
Todd L. Graves, Mary Jean Harrold, Jung-Min Kim, Adam A. Porter, Gregg Rothermel
2001 J jnl
Does Code Decay? Assessing the Evidence from Change Management Data.
IEEE Trans. Software Eng.
Stephen G. Eick, Todd L. Graves, Alan F. Karr, J. S. Marron, Audris Mockus
2001 J jnl
Identifying Productivity Drivers by Modeling Work Units Using Partial Data.
Technometrics
Todd L. Graves, Audris Mockus
2000 B conf
A Web-Based Approach to Interactive Visualization in Context.
Advanced Visual Interfaces
Audris Mockus, Stacie Hibino, Todd L. Graves
2000 J jnl
Predicting Fault Incidence Using Software Change History.
IEEE Trans. Software Eng.
Todd L. Graves, Alan F. Karr, J. S. Marron, Harvey P. Siy
1999 A* conf
Using Version Control Data to Evaluate the Impact of Software Tools.
ICSE
David L. Atkins, Thomas Ball, Todd L. Graves, Audris Mockus
1998 J jnl
A Web Laboratory for Software Data Analysis.
World Wide Web
Stephen G. Eick, Todd L. Graves, Alan F. Karr, Audris Mockus
1998 A* conf
An Empirical Study of Regression Test Selection Techniques.
ICSE
Todd L. Graves, Mary Jean Harrold, Jung-Min Kim, Adam A. Porter, Gregg Rothermel
1998 — conf
Inferring Change Effort from Configuration Management Databases.
IEEE METRICS
Todd L. Graves, Audris Mockus