| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
An effective test-per-clock test scheme based on dynamically-partitioned reconfigurable scan chains.
Integr.
|
| 2025 | J | jnl |
Integr.
|
| 2025 | J | jnl |
Neural Networks
|
| 2025 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2024 | J | jnl |
Neural Networks
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Appl. Soft Comput.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | B | conf |
SMC
|
| 2016 | — | conf |
ICCI*CC
|
| 2015 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2015 | J | jnl |
J. Electron. Test.
|