Tianxu Zhao

11 papers C 1Journal 7Unranked 3
YearRankTypeTitle / Venue / Authors
2024 J jnl
Design and Optimization of Electric Vehicle Traction Motor Considering Rotor Topology and Manufacturing Uncertainty.
IEEE Trans. Ind. Electron.
Yuan Cheng, Ling Ding, Tianxu Zhao, Shumei Cui
2023 J jnl
Analytical Calculation Method of Motor Natural Frequencies Based on Equivalent Model of Three-Layer Cylindrical Shell.
IEEE Trans. Ind. Electron.
Bingnan Zhang, Tianxu Zhao, Mingliang Yang, Qing Wang, Shumei Cui
2023 C conf
Research on Suppression Method of Bearing Current for Electric Vehicle Motor Driven by SiC Inverter.
IECON
Yuan Cheng, Mingliang Yang, Hengyi Peng, Bochao Du, Tianxu Zhao, Shumei Cui
2023 J jnl
Third-Harmonic Current Injection Control of Five-Phase Permanent-Magnet Synchronous Motor Based on Third-Harmonic Current Reference Online Identification.
IEEE Access
Jianhua Li, Bochao Du, Tianxu Zhao, Yuan Cheng, Shumei Cui
2022 J jnl
Current Sensor Fault-Tolerant Control for Five-Phase PMSM Drives Based on Third-Harmonic Space.
IEEE Trans. Ind. Electron.
Jianhua Li, Bochao Du, Tianxu Zhao, Shaopeng Wu, Shumei Cui
2022 J jnl
Sensorless Control of Five-Phase Permanent-Magnet Synchronous Motor Based on Third-Harmonic Space.
IEEE Trans. Ind. Electron.
Jianhua Li, Bochao Du, Tianxu Zhao, Yuan Cheng, Shumei Cui
2021 J jnl
Robust Nonfragile Guaranteed Cost Control for Uncertain Fuzzy Markov Jump Systems with Time-Varying Delays.
Int. J. Uncertain. Fuzziness Knowl. Based Syst.
Miao He, Junmin Li, Tianxu Zhao
2020 J jnl
Sensorless Control Strategy for IPMSM to Reduce Audible Noise by Variable Frequency Current Injection.
IEEE Trans. Ind. Electron.
Bochao Du, Tianxu Zhao, Shouliang Han, Liwei Song, Shumei Cui
2003 — conf
Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip.
DFT
Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma
2001 — conf
Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.
DFT
Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen
2000 — conf
VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy.
DFT
Tianxu Zhao, Yue Hao, Yong-Chang Jiao