Tianmei Li

14 papers Journal 12Unranked 2
YearRankTypeTitle / Venue / Authors
2024 J jnl
Interactive Prognosis Framework Between Deep Learning and a Stochastic Process Model for Remaining Useful Life Prediction.
IEEE Trans. Neural Networks Learn. Syst.
Hong Pei, Xiaosheng Si, Tianmei Li, Zhengxin Zhang, Yaguo Lei
2023 J jnl
Bayesian Deep-Learning-Based Prognostic Model for Equipment Without Label Data Related to Lifetime.
IEEE Trans. Syst. Man Cybern. Syst.
Hong Pei, Xiao-Sheng Si, Changhua Hu, Tianmei Li, Chuan He, Zhenan Pang
2023 J jnl
Prognosis for stochastic degrading systems with massive data: A data-model interactive perspective.
Reliab. Eng. Syst. Saf.
Tianmei Li, Hong Pei, Xiaosheng Si, Yaguo Lei
2022 J jnl
Nonlinear degradation modeling and prognostics: A Box-Cox transformation perspective.
Reliab. Eng. Syst. Saf.
Xiao-Sheng Si, Tianmei Li, Jianxun Zhang, Yaguo Lei
2021 — conf
A New Missing Data Generation Method Based on An Improved DCGAN With Application to RUL Prediction.
CAA SAFEPROCESS
Shengfei Zhang, Tianmei Li, Xiaosheng Si, Changhua Hu, Hao Zhang, Yuzhe Ma
2021 J jnl
A joint order-replacement policy for deteriorating components with reliability constraint.
Sci. China Inf. Sci.
Xiaosheng Si, Changhua Hu, Tianmei Li, Qi Zhang
2021 J jnl
An adaptive prognostics method for fusing CDBN and diffusion process: Application to bearing data.
Neurocomputing
Hong Pei, Xiao-Sheng Si, Chang-Hua Hu, Jian-Fei Zheng, Tianmei Li, Jianxun Zhang, Zhenan Pang
2021 J jnl
Optimal replacement of degrading components: a control-limit policy.
Sci. China Inf. Sci.
Xiaosheng Si, Tianmei Li, Qi Zhang
2021 — conf
Sneak circuit analysis considering component performance degradation under digital twin model.
CAA SAFEPROCESS
Yuzhe Ma, Tianmei Li, Xiaosheng Si, Changhua Hu, Shengfei Zhang, Hao Zhang
2020 J jnl
A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction.
IEEE Access
Tianmei Li, Hong Pei, Zhenan Pang, Xiaosheng Si, Jian-Fei Zheng
2020 J jnl
NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction.
IEEE Access
Tianmei Li, Xiaosheng Si, Zonghao Yang, Hong Pei, Yuzhe Ma
2019 J jnl
A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements.
IEEE Trans. Reliab.
Xiaosheng Si, Tianmei Li, Qi Zhang
2018 J jnl
An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals.
IEEE Trans. Reliab.
Xiaosheng Si, Tianmei Li, Qi Zhang, Xiaoxiang Hu
2016 J jnl
A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function.
IEEE Trans. Syst. Man Cybern. Syst.
Chenxu Zhao, Krishna R. Pattipati, Guanjun Liu, Jing Qiu, Kehong Lv, Tianmei Li