Tian-Li Wu

20 papers C 1Journal 9Unranked 10
YearRankTypeTitle / Venue / Authors
2025 — conf
Comprehensive Analysis of DC, Pulsed, and RF Performance of Submicron GaN-on-Si MIS-HEMTs Under Gamma Radiation.
IRPS
Anant Johari, Chin-Ya Su, Der-Sheng Chao, Ankur Gupta, Rajendra Singh, Tian-Li Wu
2025 J jnl
Demonstration of TFTs 3D Monolithically Integrated on GaN HEMTs using Cascode Configuration with High Breakdown Voltage (>1900V).
CoRR
Tian-Li Wu, Hsin-Jou Ho, Chia-Wei Liu, Yi-Chen Chen
2025 — conf
Perspectives on GaN MISHEMT Power Amplifier Versus Positive Gate Bias Instability.
IRPS
Hao Yu, Rana ElKashlan, Meng-Che Tsai, Yi Yang, Mamoun Guenach, Ying-Chun Kuo, Sachin Yadav, Barry J. O'Sullivan, Aarti Rathi, Amratansh Gupta, Dongping Xiao, Claude Desset, AliReza Alian, Uthayasankaran Peralagu, Valeri Afans'ev, Tian-Li Wu, Bertrand Parvais, Nadine Collaert
2025 — conf
Toward Understanding Stability of RF MIS-HEMTs Under ON/SEMI-ON/OFF-State Pulses with Scaling in-situ SiN Thicknesses.
IRPS
Yi Yang, Hao Yu, Meng-Che Tsai, Wei-Tung Lin, Ying-Chun Kuo, Barry J. O'Sullivan, Aarti Rathi, Amratansh Gupta, Sachin Yadav, AliReza Alian, Uthayasankaran Peralagu, Bertrand Parvais, Nadine Collaert, Tian-Li Wu
2024 J jnl
Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices.
IEEE Trans. Ind. Electron.
Rustam Kumar, Tian-Li Wu
2023 — conf
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices.
IRPS
Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey
2023 J jnl
Demonstration of Differential Mode Ferroelectric Field-Effect Transistor Array-Based in-Memory Computing Macro for Realizing Multiprecision Mixed-Signal Artificial Intelligence Accelerator.
Adv. Intell. Syst.
Vivek Parmar, Franz Müller, Jing-Hua Hsuen, Sandeep Kaur Kingra, Nellie Laleni, Yannick Raffel, Maximilian Lederer, Alptekin Vardar, Konrad Seidel, Taha Soliman, Tobias Kirchner, Tarek Ali, Stefan Dünkel, Sven Beyer, Tian-Li Wu, Sourav De, Manan Suri, Thomas Kämpfe
2023 J jnl
H-Bridge Derived Topology for Dynamic On-Resistance Evaluation in Power GaN HEMTs.
IEEE Trans. Ind. Electron.
Rustam Kumar, Arnab Sarkar, Sandeep Anand, Amit Verma, Tian-Li Wu
2023 J jnl
Using Graph Attention Network to Reversely Design GaN MIS-HEMTs Based on Hand-Drawn Characteristics.
IEEE Access
Yi-Ming Tseng, Bang-Ren Chen, Wei-Cheng Lin, Wen-Jay Lee, Nan-Yow Chen, Tian-Li Wu
2022 C conf
Comprehensive Study on Dynamic on-resistance Evaluation Circuit for Power GaN HEMTs Devices.
IECON
Rustam Kumar, Suvendu Samanta, Tian-Li Wu
2022 — conf
Demonstration of Patterned GaN RF MIS-HEMTs Growing on Hybrid Oriented Silicon-on-Insulator (SOI) Substrates.
DRC
Bao-Yuan Wang, Chin-Ya Su, Tian-Li Wu
2022 — conf
Device optimization for 200V GaN-on-SOI Platform for Monolithicly Integrated Power Circuits.
ESSDERC
Olga Syshchyk, Thibault Cosnier, Zheng-Hong Huang, Deepthi Cingu, Dirk Wellekens, Anurag Vohra, Karen Geens, Pavan Vudumula, Urmimala Chatterjee, Stefaan Decoutere, Tian-Li Wu, Benoit Bakeroot
2021 — conf
Fabrication of Light-Emitting AlGaN/GaN High Electron Mobility Transistors with a Single Quantum Well Inserted.
DRC
Chih-Yao Chang, Kuan-Ju Wu, Yao-Luen Shen, Tian-Li Wu, Wei-Hung Kuo, Suh-Fang Lin, Chih-Fang Huang
2018 — conf
Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs under source current and drain bias stresses.
IRPS
Chih-Yi Yang, Tian-Li Wu, Tin-En Hsieh, Edward Yi Chang
2016 J jnl
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis.
Microelectron. Reliab.
Isabella Rossetto, Matteo Meneghini, Vanessa Rizzato, Maria Ruzzarin, Andrea Favaron, Steve Stoffels, Marleen Van Hove, Niels Posthuma, Tian-Li Wu, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni
2016 J jnl
Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate.
Microelectron. Reliab.
Gaudenzio Meneghesso, Matteo Meneghini, Davide Bisi, Isabella Rossetto, Tian-Li Wu, Marleen Van Hove, Denis Marcon, Steve Stoffels, Stefaan Decoutere, Enrico Zanoni
2015 J jnl
Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs.
Microelectron. Reliab.
Isabella Rossetto, Matteo Meneghini, Davide Bisi, Alessandro Barbato, Marleen Van Hove, Denis Marcon, Tian-Li Wu, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni
2015 — conf
Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs.
IRPS
Tian-Li Wu, Denis Marcon, Brice De Jaeger, Marleen Van Hove, Benoit Bakeroot, Steve Stoffels, Guido Groeseneken, Stefaan Decoutere, Robin Roelofs
2014 J jnl
Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress.
Microelectron. Reliab.
Tian-Li Wu, Denis Marcon, Steve Stoffels, Shuzhen You, Brice De Jaeger, Marleen Van Hove, Guido Groeseneken, Stefaan Decoutere
2012 — conf
High temperature behaviour of GaN-on-Si high power MISHEMT devices.
ESSDERC
Dirk Wellekens, Rafael Venegas, Xuanwu Kang, Mohammed Zahid, Tian-Li Wu, Denis Marcon, Puneet Srivastava, Marleen Van Hove, Stefaan Decoutere