Tiago R. Balen

56 papers A 1B 1C 2Misc 3Journal 12Unranked 37

Year	Rank	Type	Title / Venue / Authors
2026	—	`conf`	Case Study: Neutron-Induced SEE Evaluation in a Mixed-Signal Programmable SoC. LATS Eduardo Lazzarotto Fabbris, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen
2026	—	`conf`	Evaluating an Analog Test Pattern Generation Tool by Means of Hardware-Emulated Fault Injection. LATS Luis A. Duarte, Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
2026	—	`conf`	Fast Statistical Estimation of Circuit-Level Cross Section Considering Logical Masking Effects. LATS Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen
2025	—	`conf`	A Resistorless Low-Power Differentiator for MPPT Adjustment of Energy Harvesting Systems. SBCCI Raphael Cardoso, Fábio Rabuske, Tiago R. Balen, Hamilton Klimach, Sergio Bampi
2025	J	`jnl`	Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. IEEE Des. Test Állan G. Ferreira, Lucas B. Zilch, Marcelo Soares Lubaszewski, Tiago R. Balen
2025	J	`jnl`	Variability and Analog Parameter Characterization in Enclosed Layout Transistors. J. Electron. Test. Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen
2024	—	`conf`	Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. LATS Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen
2024	—	`conf`	Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. LATS Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen
2023	J	`jnl`	Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen
2023	—	`conf`	Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen
2022	—	`conf`	Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC. SBCCI Rodrigo N. Wuerdig, Bruno Canal, Tiago R. Balen, Sergio Bampi
2022	—	`conf`	Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
2022	—	`conf`	Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen
2022	—	`conf`	Hybrid Comparator and Window Switching Scheme for low-power SAR ADC. LASCAS Bruno Canal, Hamilton Klimach, Sergio Bampi, Tiago R. Balen
2022	—	`conf`	Time Assisted SAR ADC with Bit-guess and Digital Error Correction. SBCCI Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen
2021	—	`conf`	Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen
2020	—	`conf`	Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology. SBCCI Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen
2020	J	`jnl`	Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2020	J	`jnl`	Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. J. Electron. Test. Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen
2020	—	`conf`	Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
2020	—	`conf`	Influence of sampling frequency on TID response of SAR ADCs. LATS Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen
2020	—	`conf`	Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier. SBCCI Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen
2019	—	`conf`	A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2019	—	`conf`	Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC. LATS Luiz G. S. Dias, Carlos J. González, Fernando J. Boeira, Tiago R. Balen
2019	J	`jnl`	Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2018	—	`conf`	Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2017	C	`conf`	Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
2017	—	`conf`	Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
2017	—	`conf`	Evaluation of a mixed-signal design diversity system under radiation effects. LATS Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen
2017	—	`conf`	Low cost automatic test vector generation for structural analog testing. LATS André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen
2017	J	`jnl`	Single event transient effects on charge redistribution SAR ADCs. Microelectron. Reliab. Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen
2016	—	`conf`	Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry. LATS Guilherme Schwanke Cardoso, Tiago R. Balen
2016	J	`jnl`	Radiation Effects in Low Power and Ultra-Low Power Voltage References. J. Low Power Electron. Daniel Fusco, Tiago R. Balen
2016	—	`conf`	Radiation effects in low power and ultra low power voltage references. LATS Daniel Fusco, Tiago R. Balen
2016	—	`conf`	Study of layout extraction accuracy on W/L estimation of ELT in analog design flow. LASCAS Guilherme Schwanke Cardoso, Tiago R. Balen
2015	J	`jnl`	Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen
2015	—	`conf`	Testing fully differential amplifiers using common mode feedback circuit: A case study. LASCAS Isis D. Bender, Guilherme Schwanke Cardoso, Arthur C. de Oliveira, Lucas C. Severo, Alessandro Girardi, Tiago R. Balen
2014	—	`conf`	Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution. LATW Alisson J. C. Lanot, Tiago R. Balen
2014	—	`conf`	Design diversity redundancy with spatial-temporal voting applied to data acquisition systems. LATW Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen
2014	—	`conf`	Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. SBCCI Alisson J. C. Lanot, Tiago R. Balen
2013	—	`conf`	Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski
2012	—	`conf`	Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
2011	—	`conf`	Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski
2010	—	`conf`	Diversity TMR: Proof of concept in a mixed-signal case. LATW Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	—	`conf`	Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	B	`conf`	Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski
2010	C	`conf`	Radiation effects on programmable analog devices and mitigation techniques. IOLTS Tiago R. Balen, Marcelo Lubaszewski
2009	—	`conf`	Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
2007	J	`jnl`	Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2007	—	`conf`	Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell
2006	Misc	`conf`	Functional Test of Field Programmable Analog Arrays. VTS Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2005	J	`jnl`	Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
2005	J	`jnl`	Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
2005	Misc	`conf`	Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
2004	Misc	`conf`	An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
2004	A	`conf`	Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski