Thomas Zimmer

45 papers C 2Journal 21Unranked 22
YearRankTypeTitle / Venue / Authors
2025 — conf
Remote Photovoltaic Laboratories: Bridging Continents for Hands-on Solar Module Characterization.
exp.at
Thomas Zimmer, Andrés Gamboa Baldi, Fabrice Mauvy, Alex Villazón, Omar Ormachea
2024 — conf
A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications.
BCICTS
Pascal Chevalier, Florian Cacho, C. Durand, N. Derrier, V. Millon, Frederic Monsieur, A. Gauthier, P. Billy, Sébastien Fregonese, Thomas Zimmer, H. Audouin, Michel Buczko, Didier Céli, C. Deglise-Favre, Cheikh Diouf, O. Foissey, M. Hello, N. Guitard, S. Madassamy, S. Ramirez-Ruiz, C. Renard, F. Sonnerat, V. Yon, D. Gloria, G. Waltisperger
2024 — conf
On the Safe Operating Area of InP HBTs.
BCICTS
Markus Müller, Sébastien Fregonese, Christoph Weimer, Guangsheng Liang, Xiaodi Jin, Maximilian Froitzheim, Thomas Zimmer, Michael Schröter
2023 — conf
Electro-Thermal Investigation of SiGe HBTs: A Review.
BCICTS
Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty
2021 — conf
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.
BCICTS
Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer
2019 — conf
Collector-substrate modeling of SiGe HBTs up to THz range.
BCICTS
Bishwadeep Saha, Sébastien Frégonese, Soumya Ranjan Panda, Anjan Chakravorty, Didier Céli, Thomas Zimmer
2019 — conf
Measurement based accurate definition of the SOA edges for SiGe HBTs.
BCICTS
Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer
2019 — conf
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range.
BCICTS
Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer
2018 — conf
2D RF Electronics: from devices to circuits - challenges and applications.
DRC
D. Fadi, Wei Wei, Emiliano Pallecchi, M. Anderson, J. Stake, Marina Deng, Sébastien Fregonese, Thomas Zimmer, Henri Happy
2018 J jnl
A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging.
IEEE J. Solid State Circuits
Philipp Hillger, Ritesh Jain, Janusz Grzyb, Wolfgang Forster, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer
2018 — conf
A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS.
ISSCC
Philipp Hillger, Ritesh Jain, Janusz Grzyb, Laven Mavarani, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer
2017 — conf
A two-step de-embedding method valid up to 110 GHz.
ICM
J. Bazzi, H. Kassem, Arnaud Curutchet, Franck Pourchon, N. Derrier, Didier Céli, Thomas Zimmer
2017 J jnl
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.
Microelectron. Reliab.
C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux
2017 J jnl
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications.
Proc. IEEE
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
2016 — conf
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
ESSDERC
C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Boeck, Klaus Aufinger
2016 — conf
Physics-based electrical compact model for monolayer Graphene FETs.
ESSDERC
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer, Wei Wei, Henri Happy
2015 — conf
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors.
ESSDERC
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer
2015 — conf
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs.
ESSDERC
C. Mukherjee, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, Wei Wei
2015 J jnl
From the eScience Project Chair.
Int. J. Interact. Mob. Technol.
Thomas Zimmer
2015 C conf
Graphene FET evaluation for RF and mmWave circuit applications.
ISCAS
Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux, Thomas Zimmer
2015 — conf
HeliosLab: A remote photovoltaic laboratory.
exp.at
Thomas Zimmer, Michel Billaud, Emmanouil D. Fylladitakis, Petros J. Axaopoulos
2015 J jnl
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab.
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
2015 J jnl
Remote Lab Experiments in Electronics for Use and Reuse.
Int. J. Interact. Mob. Technol.
Thomas Zimmer, Michel Billaud, M. Pic, Didier Geoffroy
2015 — conf
Substrate-coupling effect in BiCMOS technology for millimeter wave applications.
NEWCAS
Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux, Thomas Zimmer
2014 J jnl
Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries.
Int. J. Online Eng.
Thrasyvoulos Tsiatsos, Stella Douka, Apostolos Mavridis, Stergios Tegos, Ahmed Naddami, Thomas Zimmer, Didier Geoffroy
2014 — conf
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
ESSDERC
C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele
2014 J jnl
TEMPUS Project eSience.
Int. J. Online Eng.
Thomas Zimmer
2012 J jnl
Impact of Power Consumption and Temperature on Processor Lifetime Reliability.
J. Low Power Electron.
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
2012 — conf
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz.
ESSDERC
Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer
2011 J jnl
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices.
IEEE Trans. Circuits Syst. I Regul. Pap.
Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo, Vincent Derycke, Christian Gamrat, Jacques-Olivier Klein
2011 J jnl
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab.
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
2011 J jnl
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.
Microelectron. Reliab.
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
2010 — conf
From nanoscale technology scenarios to compact device models for ambipolar devices.
ICECS
Sébastien Fregonese, Cristell Maneux, Thomas Zimmer
2010 C conf
High Level Power and Energy Exploration Using ArchC.
SBAC-PAD
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
2010 J jnl
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.
Microelectron. Reliab.
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
2010 J jnl
Thermal aging model of InP/InGaAs/InP DHBT.
Microelectron. Reliab.
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
2009 J jnl
A Distance Measurement Platform Dedicated to Electrical Engineering.
IEEE Trans. Learn. Technol.
Noëlle Lewis, Michel Billaud, Didier Geoffroy, Philippe Cazenave, Thomas Zimmer
2007 J jnl
CNTFET Modeling and Reconfigurable Logic-Circuit Design.
IEEE Trans. Circuits Syst. I Regul. Pap.
Ian O'Connor, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement, Cristell Maneux, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel, Trong-Trinh Dang, Régis Leveugle
2007 J jnl
Integration of remote lab exercises into standard course packages.
Int. J. Online Eng.
Thomas Zimmer, Michel Billaud, Didier Geoffroy
2006 J jnl
A remote laboratory for electrical engineering education.
Int. J. Online Eng.
Didier Geoffroy, Thomas Zimmer, Michel Billaud
2005 J jnl
An Analog Circuit Fault Characterization Methodology.
J. Electron. Test.
Yvan Maidon, Thomas Zimmer, André Ivanov
2004 J jnl
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab.
Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer
2004 J jnl
Representation of the SiGe HBT's thermal impedance by linear and recursive networks.
Microelectron. Reliab.
Hassene Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese
1999 — conf
Hierarchical Analogue Design and Behavioural Modelling.
MSE
Thomas Zimmer, Noëlle Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat
1997 — conf
A World-Wide-Web based instrumentation pool real testing in a virtual world.
MSE
Thomas Zimmer, Patrice Kadionik, Yves Danto