Thiago Santos Copetti

16 papers C 3Journal 2Unranked 10

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime. LATS Thiago Santos Copetti, Supriya Chakraborty, Letícia Maria Bolzani Poehls
2024	J	`jnl`	A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. J. Electron. Test. Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls
2024	C	`conf`	Understanding Transistor Aging Impact on the Behavior of RRAM Cells. VLSI-SoC Seyed Hossein Hashemi Shadmehri, Supriya Chakraborty, Thiago Santos Copetti, Fabian Luis Vargas, Letícia Maria Bolzani Poehls
2023	—	`conf`	Evaluating a New RRAM Manufacturing Test Strategy. LATS Thiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani
2022	—	`conf`	Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls
2021	—	`conf`	A DfT Strategy for Detecting Emerging Faults in RRAMs. VLSI-SoC (Selected Papers) Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Bolzani Pöhls
2021	—	`conf`	Evaluating the Impact of Process Variation on RRAMs. LATS E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani
2021	—	`conf`	Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS Guilherme Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui
2021	—	`—`	Reliability evaluation of finFET-based SRAMs in the presence of resistive defects Thiago Santos Copetti
2021	C	`conf`	Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs. VLSI-SoC Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Veiras Bolzani
2019	—	`conf`	A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2017	C	`conf`	Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
2017	—	`conf`	Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
2016	J	`jnl`	Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
2015	—	`conf`	Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls
2014	—	`conf`	Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti