Thiago Copetti

17 papers C 2Journal 7Unranked 8
YearRankTypeTitle / Venue / Authors
2024 — conf
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs.
LATS
Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani
2023 — conf
Characterization and Test of Intermittent Over RESET in RRAMs.
ATS
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui
2021 J jnl
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.
J. Electron. Test.
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen
2021 J jnl
Review of Manufacturing Process Defects and Their Effects on Memristive Devices.
J. Electron. Test.
Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke
2020 J jnl
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.
J. Electron. Test.
Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2020 — conf
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.
LATS
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
2019 J jnl
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.
J. Electron. Test.
Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2018 — conf
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.
LATS
Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2017 J jnl
Analysing NBTI Impact on SRAMs with Resistive Defects.
J. Electron. Test.
M. Tulio Martins, Guilherme Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls
2016 — conf
Analyzing NBTI impact on SRAMs with resistive-open defects.
LATS
M. Tulio Martins, Guilherme Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
2016 — conf
Gate-level modelling of NBTI-induced delays under process variations.
LATS
Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
2016 J jnl
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.
J. Electron. Test.
Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas
2015 — conf
NBTI-aware design of integrated circuits: a hardware-based approach.
LATS
Thiago Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas
2015 C conf
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.
DDECS
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls
2014 J jnl
An On-Chip Sensor to Monitor NBTI Effects in SRAMs.
J. Electron. Test.
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes
2012 — conf
Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM.
LATW
Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas
2012 C conf
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM.
DDECS
Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas